Katsuyuki UEMATSU

Person

Hata-machi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Physical quantity sensor device and method of adjusting physical qu...
- Patent number 10,126,145
- Issue date Nov 13, 2018
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Output value correction method for physical quantity sensor apparat...
- Patent number 9,857,782
- Issue date Jan 2, 2018
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- G05 - CONTROLLING REGULATING
Information Patent Grant
Semiconductor pressure sensor device and method of manufacturing th...
- Patent number 9,200,974
- Issue date Dec 1, 2015
- Fuji Electric Co., Ltd.
- Kazuhiro Matsunami
- G01 - MEASURING TESTING
Information Patent Grant
Signal amplification circuit
- Patent number 8,237,505
- Issue date Aug 7, 2012
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device and method of manufacturing same
- Patent number 7,772,658
- Issue date Aug 10, 2010
- Fuji Electric Systems Co., Ltd.
- Katsuyuki Uematsu
- G01 - MEASURING TESTING
Information Patent Grant
Signal amplifier circuit with a limiting voltage device
- Patent number 7,525,389
- Issue date Apr 28, 2009
- Fuji Electric Device Technology Co., Ltd.
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Over-voltage protection circuit
- Patent number 7,274,543
- Issue date Sep 25, 2007
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Polysilicon resistor semiconductor device
- Patent number 7,119,657
- Issue date Oct 10, 2006
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Open-circuit failure detection circuit
- Patent number 7,046,013
- Issue date May 16, 2006
- Fuji Electric Co., Ltd.
- Katsuyuki Uematsu
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Semiconductor physical quantity sensor with improved noise resistance
- Patent number 6,962,081
- Issue date Nov 8, 2005
- Fuji Electric Co., Ltd.
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING
Information Patent Grant
Layout of semiconductor integrated circuit
- Patent number 6,684,371
- Issue date Jan 27, 2004
- Fuji Electric Co., Ltd.
- Katsuyuki Uematsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device having an integral protection circuit
- Patent number 6,680,512
- Issue date Jan 20, 2004
- Fuji Electric Co., Ltd.
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PHYSICAL QUANTITY SENSOR DEVICE AND METHOD OF ADJUSTING PHYSICAL QU...
- Publication number 20150303935
- Publication date Oct 22, 2015
- Fuji Electric Co., Ltd.
- Mutsuo NISHIKAWA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PRESSURE SENSOR DEVICE AND METHOD FOR MANUFACTURING THE SAME
- Publication number 20150219513
- Publication date Aug 6, 2015
- Fuji Electric Co., Ltd.
- Katsuyuki UEMATSU
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR PRESSURE SENSOR DEVICE AND METHOD OF MANUFACTURING TH...
- Publication number 20150001650
- Publication date Jan 1, 2015
- Fuji Electric Co., Ltd.
- Kazuhiro MATSUNAMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OUTPUT VALUE CORRECTION METHOD FOR PHYSICAL QUANTITY SENSOR APPARAT...
- Publication number 20140358317
- Publication date Dec 4, 2014
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
PHYSICAL QUANTITY SENSING APPARATUS HAVING AN INTERNAL CIRCUIT, A F...
- Publication number 20100109647
- Publication date May 6, 2010
- Fuji Electric Device Technology Co., LTD.
- Katsuyuki Uematsu
- G01 - MEASURING TESTING
Information Patent Application
Signal amplification circuit
- Publication number 20100097146
- Publication date Apr 22, 2010
- Fuji Electric Systems Co., Ltd.
- Mutsuo Nishikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME
- Publication number 20080054384
- Publication date Mar 6, 2008
- Fuji Electric Device Technology Co., LTD.
- Katsuyuki UEMATSU
- G01 - MEASURING TESTING
Information Patent Application
Signal amplifier circuit
- Publication number 20070290761
- Publication date Dec 20, 2007
- FUJI ELECTRIC DEVICE TECHNOLOGY CO., LTD.
- Mutsuo Nishikawa
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR APPARATUS AND PHYSICAL QUANTITY SENSING APPARATUS
- Publication number 20060244101
- Publication date Nov 2, 2006
- Fuji Electric Device Technology Co., LTD.
- Katsuyuki Uematsu
- G01 - MEASURING TESTING
Information Patent Application
Over-voltage protection circuit
- Publication number 20030214769
- Publication date Nov 20, 2003
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Open-circuit failure detection circuit
- Publication number 20030197513
- Publication date Oct 23, 2003
- Katsuyuki Uematsu
- G01 - MEASURING TESTING
Information Patent Application
Overvoltage protection circuit
- Publication number 20020186518
- Publication date Dec 12, 2002
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device having an integral protection circuit
- Publication number 20020175425
- Publication date Nov 28, 2002
- Mutsuo Nishikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Polysilicon resistor semiconductor device
- Publication number 20020175379
- Publication date Nov 28, 2002
- Katsumichi Ueyanagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor physical quantity sensing device
- Publication number 20020149984
- Publication date Oct 17, 2002
- Mutsuo Nishikawa
- G01 - MEASURING TESTING
Information Patent Application
Layout of semiconductor integrated circuit
- Publication number 20020152448
- Publication date Oct 17, 2002
- Katsuyuki Uematsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor physical quantity sensor
- Publication number 20020144554
- Publication date Oct 10, 2002
- Katsumichi Ueyanagi
- G01 - MEASURING TESTING

Katsuyuki UEMATSU

Person

Patents Grantslast 30 patents

Physical quantity sensor device and method of adjusting physical qu...

Output value correction method for physical quantity sensor apparat...

Semiconductor pressure sensor device and method of manufacturing th...

Signal amplification circuit

Semiconductor device and method of manufacturing same

Signal amplifier circuit with a limiting voltage device

Over-voltage protection circuit

Polysilicon resistor semiconductor device

Open-circuit failure detection circuit

Semiconductor physical quantity sensor with improved noise resistance

Layout of semiconductor integrated circuit

Semiconductor device having an integral protection circuit

Patents Applicationslast 30 patents

PHYSICAL QUANTITY SENSOR DEVICE AND METHOD OF ADJUSTING PHYSICAL QU...

PRESSURE SENSOR DEVICE AND METHOD FOR MANUFACTURING THE SAME

SEMICONDUCTOR PRESSURE SENSOR DEVICE AND METHOD OF MANUFACTURING TH...

OUTPUT VALUE CORRECTION METHOD FOR PHYSICAL QUANTITY SENSOR APPARAT...

PHYSICAL QUANTITY SENSING APPARATUS HAVING AN INTERNAL CIRCUIT, A F...

Signal amplification circuit

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SAME

Signal amplifier circuit

SEMICONDUCTOR APPARATUS AND PHYSICAL QUANTITY SENSING APPARATUS

Over-voltage protection circuit

Open-circuit failure detection circuit

Overvoltage protection circuit

Semiconductor device having an integral protection circuit

Polysilicon resistor semiconductor device

Semiconductor physical quantity sensing device

Layout of semiconductor integrated circuit

Semiconductor physical quantity sensor