Katuhiko Takebe

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor sensor with plural gate electrodes
- Patent number 5,397,911
- Issue date Mar 14, 1995
- Honda Giken Kogyo Kabushiki Kaisha
- Satoshi Hiyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor stress sensor
- Patent number 5,381,696
- Issue date Jan 17, 1995
- Honda Giken Kogyo Kabushiki Kaisha
- Katsuki Ichinose
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor stress sensor MESFET or MESFET array
- Patent number 5,225,705
- Issue date Jul 6, 1993
- Honda Giken Kogyo Kabushiki Kaisha
- Satoshi Hiyama
- G01 - MEASURING TESTING
Information Patent Grant
Field-effect transistor type semiconductor sensor
- Patent number 5,191,237
- Issue date Mar 2, 1993
- Honda Giken Kogyo Kabushiki Kaisha
- Katuhiko Takebe
- G01 - MEASURING TESTING