Kaushik Sah

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Kessel Lo, BE

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Patents Grantslast 30 patents

Information Patent Grant
Using stochastic failure metrics in semiconductor manufacturing
- Patent number 10,818,001
- Issue date Oct 27, 2020
- KLA-Tencor Corporation
- Wing-Shan Ribi Leung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Bonded wafer metrology
- Patent number 10,540,759
- Issue date Jan 21, 2020
- KLA-Tencor Corporation
- Kaushik Sah
- G01 - MEASURING TESTING
Information Patent Grant
Aware system, method and computer program product for detecting ove...
- Patent number 10,068,323
- Issue date Sep 4, 2018
- KLA-Tencor Corporation
- Kaushik Sah
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
USING STOCHASTIC FAILURE METRICS IN SEMICONDUCTOR MANUFACTURING
- Publication number 20200082523
- Publication date Mar 12, 2020
- KLA-Tencor Corporation
- Wing-Shan Ribi Leung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Identifying Nuisances and Defects of Interest in Defects Detected o...
- Publication number 20190067060
- Publication date Feb 28, 2019
- KLA-Tencor Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Metrology Guided Inspection Sample Shaping of Optical Inspection Re...
- Publication number 20180321168
- Publication date Nov 8, 2018
- KLA-Tencor Corporation
- Kaushik Sah
- G01 - MEASURING TESTING
Information Patent Application
Bonded Wafer Metrology
- Publication number 20180150952
- Publication date May 31, 2018
- KLA-Tencor Corporation
- Kaushik Sah
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DESIGN AWARE SYSTEM, METHOD AND COMPUTER PROGRAM PRODUCT FOR DETECT...
- Publication number 20170294012
- Publication date Oct 12, 2017
- KLA-Tencor Corporation
- Kaushik Sah
- G06 - COMPUTING CALCULATING COUNTING