Kaviyesh Doshi

Person

Pearl River, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Variable resolution oscilloscope
- Patent number 10,725,070
- Issue date Jul 28, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Variable resolution oscilloscope
- Patent number 10,534,019
- Issue date Jan 14, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Time domain reflectometry step to S-parameter conversion
- Patent number 10,396,907
- Issue date Aug 27, 2019
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Time domain network analyzer
- Patent number 9,366,743
- Issue date Jun 14, 2016
- Teledyne LeCroy, Inc.
- Peter J Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for correction of time interleaved ADCs
- Patent number 9,231,608
- Issue date Jan 5, 2016
- Teledyne LeCroy, Inc.
- Peter J Pupalaikis
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Wavelet denoising for time-domain network analysis
- Patent number 8,843,335
- Issue date Sep 23, 2014
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Time domain reflectometry step to S-parameter conversion
- Patent number 8,706,433
- Issue date Apr 22, 2014
- Teledyne LeCroy, Inc.
- Peter J Pupalaikis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Time domain network analyzer
- Patent number 8,706,438
- Issue date Apr 22, 2014
- Teledyne LeCroy, Inc.
- Peter J Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Method for printed circuit board trace characterization
- Patent number 8,659,315
- Issue date Feb 25, 2014
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Grant
Method for de-embedding device measurements
- Patent number 8,566,058
- Issue date Oct 22, 2013
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Variable Resolution Oscilloscope
- Publication number 20200088766
- Publication date Mar 19, 2020
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Application
VARIABLE RESOLUTION OSCILLOSCOPE
- Publication number 20180059143
- Publication date Mar 1, 2018
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Application
TIME DOMAIN REFLECTOMETRY STEP TO S-PARAMETER CONVERSION
- Publication number 20170214476
- Publication date Jul 27, 2017
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
User Interface for Signal Integrity Network Analyzer
- Publication number 20140343883
- Publication date Nov 20, 2014
- Teledyne LeCroy, Inc.
- Jonathan Libby
- G01 - MEASURING TESTING
Information Patent Application
Time Domain Network Analyzer
- Publication number 20140176156
- Publication date Jun 26, 2014
- Teledyne LeCroy, Inc.
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Application
Time Domain Reflectometry Step to S-Parameter Conversion
- Publication number 20140098848
- Publication date Apr 10, 2014
- Teledyne LeCroy, Inc.
- Peter Pupalaikis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR PRINTED CIRCUIT BOARD TRACE CHARACTERIZATION
- Publication number 20130265079
- Publication date Oct 10, 2013
- LeCroy Corporation
- Peter J. Pupalaikis
- G01 - MEASURING TESTING
Information Patent Application
TIME DOMAIN REFLECTOMETRY STEP TO S-PARAMETER CONVERSION
- Publication number 20110191046
- Publication date Aug 4, 2011
- LeCroy Corporation
- Peter J. Pupalaikis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME DOMAIN NETWORK ANALYZER
- Publication number 20110191054
- Publication date Aug 4, 2011
- LeCroy Corporation
- Peter J. Pupalaikis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Wavelet Denoising for Time-Domain Network Analysis
- Publication number 20110191047
- Publication date Aug 4, 2011
- LeCroy Corporation
- Peter J. Pupalaikis
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for De-embedding Device Measurements
- Publication number 20100256955
- Publication date Oct 7, 2010
- LeCroy Corporation
- Peter J. Pupalaikis
- G01 - MEASURING TESTING

Kaviyesh Doshi

Person

Patents Grantslast 30 patents

Variable resolution oscilloscope

Variable resolution oscilloscope

Time domain reflectometry step to S-parameter conversion

Time domain network analyzer

Method and apparatus for correction of time interleaved ADCs

Wavelet denoising for time-domain network analysis

Time domain reflectometry step to S-parameter conversion

Time domain network analyzer

Method for printed circuit board trace characterization

Method for de-embedding device measurements

Patents Applicationslast 30 patents

Variable Resolution Oscilloscope

VARIABLE RESOLUTION OSCILLOSCOPE

TIME DOMAIN REFLECTOMETRY STEP TO S-PARAMETER CONVERSION

User Interface for Signal Integrity Network Analyzer

Time Domain Network Analyzer

Time Domain Reflectometry Step to S-Parameter Conversion

METHOD FOR PRINTED CIRCUIT BOARD TRACE CHARACTERIZATION

TIME DOMAIN REFLECTOMETRY STEP TO S-PARAMETER CONVERSION

TIME DOMAIN NETWORK ANALYZER

Wavelet Denoising for Time-Domain Network Analysis

Method for De-embedding Device Measurements