Kawakami Kenichi

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for producing assembly, reinforcing member, and assembly
- Patent number 11,332,230
- Issue date May 17, 2022
- Mitsubishi Heavy Industries, Ltd.
- Akihito Suzuki
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Motor abnormality detecting apparatus
- Patent number 6,831,477
- Issue date Dec 14, 2004
- Mitsubishi Denki Kabushiki Kaisha
- Kouji Fukusumi
- G01 - MEASURING TESTING
Information Patent Grant
Electron-beam lithography method and electron-beam lithography system
- Patent number 6,573,516
- Issue date Jun 3, 2003
- Advantest Corporation
- Kenichi Kawakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing mask data for partial one-shot transfer exposur...
- Patent number 6,546,544
- Issue date Apr 8, 2003
- Advantest Corporation
- Kenichi Kawakami
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged-particle-beam exposure device and charged-particle-beam exp...
- Patent number 6,420,700
- Issue date Jul 16, 2002
- Fujitsu Limited
- Yoshihisa Ooaeh
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged-particle-beam exposure device and charged-particle-beam exp...
- Patent number 6,242,751
- Issue date Jun 5, 2001
- Fujitsu Limited
- Akio Takemoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged-particle-beam exposure device and charged-particle-beam exp...
- Patent number 6,222,195
- Issue date Apr 24, 2001
- Fujitsu Limited
- Akio Yamada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle-beam exposure device and charged-particle-beam exp...
- Patent number 6,137,111
- Issue date Oct 24, 2000
- Fujitsu Limited
- Akio Yamada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for charged particle beam exposure
- Patent number 6,015,975
- Issue date Jan 18, 2000
- Fujitsu Limited
- Kenichi Kawakami
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged-particle-beam exposure device and charged-particle-beam exp...
- Patent number 5,969,365
- Issue date Oct 19, 1999
- Fujitsu Limited
- Akio Takemoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged particle beam exposure apparatus
- Patent number 5,966,200
- Issue date Oct 12, 1999
- Fujuitsu Limited
- Kenichi Kawakami
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Charged particle beam exposure method and apparatus
- Patent number 5,892,237
- Issue date Apr 6, 1999
- Fujitsu Limited
- Kenichi Kawakami
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of detecting a deficiency in a charged-particle-beam exposur...
- Patent number 5,830,612
- Issue date Nov 3, 1998
- Fujitsu Limited
- Akio Yamada
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged-particle-beam exposure device and charged-particle-beam exp...
- Patent number 5,757,015
- Issue date May 26, 1998
- Fujitsu Limited
- Akio Takemoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Electron-beam exposure device and a method of detecting a mark posi...
- Patent number 5,708,276
- Issue date Jan 13, 1998
- Fujitsu Limited
- Tatsuro Ohkawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR PRODUCING ASSEMBLY, REINFORCING MEMBER, AND ASSEMBLY
- Publication number 20210114712
- Publication date Apr 22, 2021
- Mitsubishi Heavy Industries, Ltd.
- Akihito SUZUKI
- B64 - AIRCRAFT AVIATION COSMONAUTICS
Information Patent Application
Motor abnormality detecting apparatus
- Publication number 20030179004
- Publication date Sep 25, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kouji Fukusumi
- G01 - MEASURING TESTING
Information Patent Application
ELECTRON-BEAM LITHOGRAPHY METHOD AND ELECTRON-BEAM LITHOGRAPHY SYSTEM
- Publication number 20020096645
- Publication date Jul 25, 2002
- KENICHI KAWAKAMI
- B82 - NANO-TECHNOLOGY
Information Patent Application
Charged-particle-beam exposure device and charged-particle-beam exp...
- Publication number 20010013581
- Publication date Aug 16, 2001
- Akio Takemoto
- B82 - NANO-TECHNOLOGY

Kawakami Kenichi

Person

Patents Grantslast 30 patents

Method for producing assembly, reinforcing member, and assembly

Motor abnormality detecting apparatus

Electron-beam lithography method and electron-beam lithography system

Method of producing mask data for partial one-shot transfer exposur...

Charged-particle-beam exposure device and charged-particle-beam exp...

Charged-particle-beam exposure device and charged-particle-beam exp...

Charged-particle-beam exposure device and charged-particle-beam exp...

Charged particle-beam exposure device and charged-particle-beam exp...

Method and apparatus for charged particle beam exposure

Charged-particle-beam exposure device and charged-particle-beam exp...

Charged particle beam exposure apparatus

Charged particle beam exposure method and apparatus

Method of detecting a deficiency in a charged-particle-beam exposur...

Charged-particle-beam exposure device and charged-particle-beam exp...

Electron-beam exposure device and a method of detecting a mark posi...

Patents Applicationslast 30 patents

METHOD FOR PRODUCING ASSEMBLY, REINFORCING MEMBER, AND ASSEMBLY

Motor abnormality detecting apparatus

ELECTRON-BEAM LITHOGRAPHY METHOD AND ELECTRON-BEAM LITHOGRAPHY SYSTEM

Charged-particle-beam exposure device and charged-particle-beam exp...