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Kayoko Taniguchi
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Kamakura, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Position detection device and conveyance device
Patent number
11,906,333
Issue date
Feb 20, 2024
DMG MORI CO., LTD.
Shigeru Ishimoto
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detection device
Patent number
11,512,942
Issue date
Nov 29, 2022
DMG MORI CO., LTD.
Akinori Suzuki
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Scale measuring device, method for generating position information,...
Patent number
9,970,788
Issue date
May 15, 2018
DMG MORI SEIKI CO., LTD.
Kayoko Taniguchi
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detection apparatus
Patent number
9,810,521
Issue date
Nov 7, 2017
DMG MORI SEIKI CO., LTD.
Akinori Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Non-contact displacement detecting device using optical astigmatism
Patent number
8,247,786
Issue date
Aug 21, 2012
Magnescale Co., Ltd.
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Grant
Displacement measuring apparatus
Patent number
7,808,650
Issue date
Oct 5, 2010
Mori Seiki Co., Ltd
Masahito Kon
G01 - MEASURING TESTING
Information
Patent Grant
Light-receiving/emitting composite unit, method for manufacturing t...
Patent number
7,336,367
Issue date
Feb 26, 2008
Sony Manufacturing Systems Corporation
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Grant
Displacement detection apparatus
Patent number
7,238,931
Issue date
Jul 3, 2007
Sony Corporation
Nobuo Nabeshima
G05 - CONTROLLING REGULATING
Information
Patent Grant
Light-receiving/emitting composite unit, method for manufacturing t...
Patent number
7,187,449
Issue date
Mar 6, 2007
Sony Precision Technology Inc.
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Grant
Information writing device
Patent number
7,136,241
Issue date
Nov 14, 2006
Sony Corporation
Kayoko Taniguchi
G11 - INFORMATION STORAGE
Information
Patent Grant
Displacement pickup
Patent number
7,034,948
Issue date
Apr 25, 2006
Sony Precision Technology
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Grant
Light-emitting/receiving combined unit and displacement sensors usi...
Patent number
6,980,303
Issue date
Dec 27, 2005
Sony Corporation
Hidehiro Kume
G01 - MEASURING TESTING
Information
Patent Grant
Displacement pickup
Patent number
6,879,405
Issue date
Apr 12, 2005
Sony Precision Technology, Inc.
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Grant
Disc recording/reproducing apparatus and servo signal writing appar...
Patent number
6,583,948
Issue date
Jun 24, 2003
Sony Precision Technology Inc.
Kayoko Taniguchi
G11 - INFORMATION STORAGE
Information
Patent Grant
Hard disc drive and a servo signal writing apparatus
Patent number
5,325,349
Issue date
Jun 28, 1994
Sony Magnescale Inc.
Kayoko Taniguchi
G11 - INFORMATION STORAGE
Information
Patent Grant
Displacement detecting apparatus using graduated linear scale
Patent number
5,247,165
Issue date
Sep 21, 1993
Sony Corporation
Akitaka Hiruta
G01 - MEASURING TESTING
Information
Patent Grant
Hologram scale, apparatus for making hologram scale, moving member...
Patent number
5,225,918
Issue date
Jul 6, 1993
Sony Magnescale, Inc.
Kayoko Taniguchi
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Optical instrument for measuring displacement
Patent number
4,676,645
Issue date
Jun 30, 1987
Sony Magnescale Incorporation
Kayoko Taniguchi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Displacement Detection Device
Publication number
20200158494
Publication date
May 21, 2020
DMG MORI CO., LTD.
Akinori Suzuki
G01 - MEASURING TESTING
Information
Patent Application
POSITION DETECTION DEVICE AND CONVEYANCE DEVICE
Publication number
20200132505
Publication date
Apr 30, 2020
DMG MORI CO., LTD.
Shigeru Ishimoto
G01 - MEASURING TESTING
Information
Patent Application
Displacement detection apparatus
Publication number
20160223317
Publication date
Aug 4, 2016
DMG MORI SEIKI CO., LTD.
Akinori SUZUKI
G01 - MEASURING TESTING
Information
Patent Application
SCALE MEASURING DEVICE, METHOD FOR GENERATING POSITION INFORMATION,...
Publication number
20140049252
Publication date
Feb 20, 2014
Mori Seiki Co., Ltd.
Kayoko Taniguchi
G01 - MEASURING TESTING
Information
Patent Application
Displacement detecting device
Publication number
20090261233
Publication date
Oct 22, 2009
SONY CORPORATION
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Application
DISPLACEMENT MEASURING APPARATUS
Publication number
20090033946
Publication date
Feb 5, 2009
SONY CORPORATION
Masahito Kon
G01 - MEASURING TESTING
Information
Patent Application
Vibration detection device
Publication number
20080225274
Publication date
Sep 18, 2008
SONY CORPORATION
Shoji Hirata
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
Light-receiving/emitting composite unit, method for manufacturing t...
Publication number
20070115479
Publication date
May 24, 2007
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Application
Displacement detection apparatus
Publication number
20050236558
Publication date
Oct 27, 2005
Nobuo Nabeshima
G05 - CONTROLLING REGULATING
Information
Patent Application
Information writing device
Publication number
20050036229
Publication date
Feb 17, 2005
SONY CORPORATION
Kayoko Taniguchi
G11 - INFORMATION STORAGE
Information
Patent Application
Displacement pickup
Publication number
20040095583
Publication date
May 20, 2004
Sony Precision Technology Inc.
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Application
Displacement pickup
Publication number
20040080755
Publication date
Apr 29, 2004
Sony Precision Technology
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Application
Light-receiving/emitting composite unit, method for manufacturing t...
Publication number
20030202189
Publication date
Oct 30, 2003
Sony Precision Technology Inc.
Hideaki Tamiya
G01 - MEASURING TESTING
Information
Patent Application
Light-emitting/receiving combined unit and displacement sensors usi...
Publication number
20030169434
Publication date
Sep 11, 2003
Hidehiro Kume
G01 - MEASURING TESTING