Kazimierz Szczpinski

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Munich, DE

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Patents Grantslast 30 patents

Information Patent Grant
Integrated circuit with a test circuit
- Patent number 7,135,723
- Issue date Nov 14, 2006
- Infineon Technologies AG
- Kazimierz Szczpinski
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Integrated circuit with a test circuit
- Publication number 20040217349
- Publication date Nov 4, 2004
- Kazimierz Szczpinski
- G01 - MEASURING TESTING