Kazuaki OHKUBO

Person

Kusatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Optical measurement apparatus
- Patent number 9,500,520
- Issue date Nov 22, 2016
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Standard light source having restriction portion for diffuse reflec...
- Patent number 9,377,352
- Issue date Jun 28, 2016
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system, optical measurement method, and mirror...
- Patent number 9,239,259
- Issue date Jan 19, 2016
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- F21 - LIGHTING
Information Patent Grant
Optical characteristic measuring apparatus
- Patent number 8,970,835
- Issue date Mar 3, 2015
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measuring apparatus
- Patent number 8,896,824
- Issue date Nov 25, 2014
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus, optical measurement system, and fibe...
- Patent number 8,456,638
- Issue date Jun 4, 2013
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus including hemispherical optical integ...
- Patent number 8,422,018
- Issue date Apr 16, 2013
- Otsuka Electronics Co., Ltd.
- Yoshihiro Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Quantum efficiency measurement method, quantum efficiency measureme...
- Patent number 8,415,639
- Issue date Apr 9, 2013
- Otsuka Electronics Co., Ltd.
- Yoshihiro Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring total luminous flux
- Patent number 8,305,576
- Issue date Nov 6, 2012
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measurement device and optical characteristi...
- Patent number 8,169,608
- Issue date May 1, 2012
- Otsuka Electronics Co., Ltd.
- Hiroyuki Sano
- G01 - MEASURING TESTING
Information Patent Grant
Optical characteristic measurement device and optical characteristi...
- Patent number 8,169,607
- Issue date May 1, 2012
- Otsuka Electronics Co., Ltd.
- Hiroyuki Sano
- G01 - MEASURING TESTING
Information Patent Grant
Quantum efficiency measurement apparatus and quantum efficiency mea...
- Patent number 8,119,996
- Issue date Feb 21, 2012
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Integrating photometer for measuring total flux of light generated...
- Patent number 7,663,744
- Issue date Feb 16, 2010
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL MEASUREMENT APPARATUS
- Publication number 20150260569
- Publication date Sep 17, 2015
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
STANDARD LIGHT SOURCE AND MEASUREMENT METHOD
- Publication number 20140224970
- Publication date Aug 14, 2014
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS
- Publication number 20140021338
- Publication date Jan 23, 2014
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G02 - OPTICS
Information Patent Application
OPTICAL CHARACTERISTIC MEASURING APPARATUS
- Publication number 20140021340
- Publication date Jan 23, 2014
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G02 - OPTICS
Information Patent Application
OPTICAL MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD, AND MIRROR...
- Publication number 20130327929
- Publication date Dec 12, 2013
- Labsphere, Inc.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTI...
- Publication number 20120075628
- Publication date Mar 29, 2012
- Otsuka Electronics Co., Ltd.
- Hiroyuki SANO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT SYSTEM, AND FIBE...
- Publication number 20110235036
- Publication date Sep 29, 2011
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREME...
- Publication number 20110226961
- Publication date Sep 22, 2011
- Otsuka Electronics Co., Ltd.
- Yoshihiro OSAWA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS INCLUDING HEMISPHERICAL OPTICAL INTEG...
- Publication number 20110205541
- Publication date Aug 25, 2011
- Otsuka Electronics Co., Ltd.
- Yoshihiro OSAWA
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM EFFICIENCY MEASUREMENT APPARATUS AND QUANTUM EFFICIENCY MEA...
- Publication number 20110155926
- Publication date Jun 30, 2011
- Otsuka Electronics Co.,Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING TOTAL LUMINOUS FLUX
- Publication number 20100296082
- Publication date Nov 25, 2010
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTI...
- Publication number 20100091280
- Publication date Apr 15, 2010
- Otsuka Electronics Co., Ltd.
- Hiroyuki SANO
- G01 - MEASURING TESTING
Information Patent Application
Integrating Photometer for Measuring Total Flux of Light Generated...
- Publication number 20090109428
- Publication date Apr 30, 2009
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G01 - MEASURING TESTING

Kazuaki OHKUBO

Person

Patents Grantslast 30 patents

Optical measurement apparatus

Standard light source having restriction portion for diffuse reflec...

Optical measurement system, optical measurement method, and mirror...

Optical characteristic measuring apparatus

Optical characteristic measuring apparatus

Optical measurement apparatus, optical measurement system, and fibe...

Optical measurement apparatus including hemispherical optical integ...

Quantum efficiency measurement method, quantum efficiency measureme...

Apparatus and method for measuring total luminous flux

Optical characteristic measurement device and optical characteristi...

Optical characteristic measurement device and optical characteristi...

Quantum efficiency measurement apparatus and quantum efficiency mea...

Integrating photometer for measuring total flux of light generated...

Patents Applicationslast 30 patents

OPTICAL MEASUREMENT APPARATUS

STANDARD LIGHT SOURCE AND MEASUREMENT METHOD

OPTICAL CHARACTERISTIC MEASURING APPARATUS

OPTICAL CHARACTERISTIC MEASURING APPARATUS

OPTICAL MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD, AND MIRROR...

OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTI...

OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT SYSTEM, AND FIBE...

QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREME...

OPTICAL MEASUREMENT APPARATUS INCLUDING HEMISPHERICAL OPTICAL INTEG...

QUANTUM EFFICIENCY MEASUREMENT APPARATUS AND QUANTUM EFFICIENCY MEA...

APPARATUS AND METHOD FOR MEASURING TOTAL LUMINOUS FLUX

OPTICAL CHARACTERISTIC MEASUREMENT DEVICE AND OPTICAL CHARACTERISTI...

Integrating Photometer for Measuring Total Flux of Light Generated...