Kazufumi Kubota

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Secondary particle detection system of scanning electron microscope
- Patent number 10,515,778
- Issue date Dec 24, 2019
- NGR Inc.
- Sumio Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image generation apparatus
- Patent number 9,793,091
- Issue date Oct 17, 2017
- NGR Inc.
- Hideaki Teshima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 8,045,785
- Issue date Oct 25, 2011
- NGR Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 7,817,844
- Issue date Oct 19, 2010
- Nanogeometry Research Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern inspection apparatus and method
- Patent number 7,796,801
- Issue date Sep 14, 2010
- Nanogeometry Research Inc.
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE
- Publication number 20180005797
- Publication date Jan 4, 2018
- NGR Inc.
- Makoto KATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SECONDARY PARTICLE DETECTION SYSTEM OF SCANNING ELECTRON MICROSCOPE
- Publication number 20170271124
- Publication date Sep 21, 2017
- NGR Inc.
- Sumio SASAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PATTERN INSPECTION APPARATUS AND METHOD
- Publication number 20100303334
- Publication date Dec 2, 2010
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20060245636
- Publication date Nov 2, 2006
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20050146714
- Publication date Jul 7, 2005
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Pattern inspection apparatus and method
- Publication number 20040081350
- Publication date Apr 29, 2004
- Tadashi Kitamura
- G06 - COMPUTING CALCULATING COUNTING