Kazufumi NISHIDA

Person

Musashino-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement apparatus, measurement method, and computer readable me...
- Patent number 10,982,949
- Issue date Apr 20, 2021
- Yokogawa Electric Corporation
- Kazufumi Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Displacement sensor
- Patent number 10,634,489
- Issue date Apr 28, 2020
- Yokogawa Electric Corporation
- Naomichi Chida
- G02 - OPTICS
Information Patent Grant
Signal detection device and optical characteristics measurement device
- Patent number 10,345,231
- Issue date Jul 9, 2019
- Yokogawa Electric Corporation
- Kazuki Setsuda
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Displacement sensor, spectral characteristic measuring apparatus, c...
- Patent number 9,605,949
- Issue date Mar 28, 2017
- Yokogawa Electric Corporation
- Atsushi Tsujii
- G01 - MEASURING TESTING
Information Patent Grant
Displacement sensor, spectral characteristic measuring apparatus, c...
- Patent number 9,488,468
- Issue date Nov 8, 2016
- Yokogawa Electric Corporation
- Atsushi Tsujii
- G01 - MEASURING TESTING
Information Patent Grant
Multichannel photometric measurement apparatus
- Patent number 8,547,544
- Issue date Oct 1, 2013
- Yokogawa Electric Corporation
- Kumiko Horikoshi
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for measuring thickness of multilayer film
- Patent number 8,279,453
- Issue date Oct 2, 2012
- Yokogawa Electric Corporation
- Kazufumi Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring film thickness
- Patent number 7,646,489
- Issue date Jan 12, 2010
- Yokogawa Electric Corporation
- Kazufumi Nishida
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INFORMATION PROVIDING APPARATUS, INFORMATION PROVIDING METHOD, AND...
- Publication number 20240410834
- Publication date Dec 12, 2024
- YOKOGAWA ELECTRIC CORPORATION
- Kazufumi NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
ORGANIC EL DISPLAY DEVICE
- Publication number 20240085784
- Publication date Mar 14, 2024
- TOYO INK SC HOLDINGS CO., LTD
- Taketo KOGURE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
COLORIMETER AND CHROMATICITY MEASUREMENT METHOD
- Publication number 20230384159
- Publication date Nov 30, 2023
- Yokogawa Electric Corporation
- Ryutaro Maki
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATING SPHERE
- Publication number 20230062325
- Publication date Mar 2, 2023
- YOKOGAWA ELECTRIC CORPORATION
- Kazufumi Nishida
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM
- Publication number 20200173767
- Publication date Jun 4, 2020
- YOKOGAWA ELECTRIC CORPORATION
- Kazufumi NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT SENSOR
- Publication number 20190078875
- Publication date Mar 14, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Naomichi CHIDA
- G02 - OPTICS
Information Patent Application
SIGNAL DETECTION DEVICE AND OPTICAL CHARACTERISTICS MEASUREMENT DEVICE
- Publication number 20180149587
- Publication date May 31, 2018
- YOKOGAWA ELECTRIC CORPORATION
- Kazuki SETSUDA
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DISPLACEMENT SENSOR, SPECTRAL CHARACTERISTIC MEASURING APPARATUS, C...
- Publication number 20170023355
- Publication date Jan 26, 2017
- YOKOGAWA ELECTRIC CORPORATION
- Atsushi TSUJII
- G01 - MEASURING TESTING
Information Patent Application
DISPLACEMENT SENSOR, SPECTRAL CHARACTERISTIC MEASURING APPARATUS, C...
- Publication number 20140104623
- Publication date Apr 17, 2014
- YOKOGAWA ELECTRIC CORPORATION
- Atsushi TSUJII
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL PHOTOMETRIC MEASUREMENT APPARATUS
- Publication number 20120019815
- Publication date Jan 26, 2012
- YOKOGAWA ELECTRIC CORPORATION
- Kumiko Horikoshi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR MEASURING THICKNESS OF MULTILAYER FILM
- Publication number 20110102812
- Publication date May 5, 2011
- YOKOGAWA ELECTRIC CORPORATION
- Kazufumi NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
FILM THICKNESS MEASUREMENT APPARATUS
- Publication number 20110040510
- Publication date Feb 17, 2011
- YOKOGAWA ELECTRIC CORPORATION
- Kazufumi NISHIDA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING FILM THICKNESS
- Publication number 20080266550
- Publication date Oct 30, 2008
- YOKOGAWA ELECTRIC CORPORATION
- Kazufumi NISHIDA
- G01 - MEASURING TESTING

Kazufumi NISHIDA

Person

Patents Grantslast 30 patents

Measurement apparatus, measurement method, and computer readable me...

Displacement sensor

Signal detection device and optical characteristics measurement device

Displacement sensor, spectral characteristic measuring apparatus, c...

Displacement sensor, spectral characteristic measuring apparatus, c...

Multichannel photometric measurement apparatus

Method and device for measuring thickness of multilayer film

Apparatus and method for measuring film thickness

Patents Applicationslast 30 patents

INFORMATION PROVIDING APPARATUS, INFORMATION PROVIDING METHOD, AND...

ORGANIC EL DISPLAY DEVICE

COLORIMETER AND CHROMATICITY MEASUREMENT METHOD

INTEGRATING SPHERE

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND MEASUREMENT PROGRAM

DISPLACEMENT SENSOR

SIGNAL DETECTION DEVICE AND OPTICAL CHARACTERISTICS MEASUREMENT DEVICE

DISPLACEMENT SENSOR, SPECTRAL CHARACTERISTIC MEASURING APPARATUS, C...

DISPLACEMENT SENSOR, SPECTRAL CHARACTERISTIC MEASURING APPARATUS, C...

MULTICHANNEL PHOTOMETRIC MEASUREMENT APPARATUS

METHOD AND DEVICE FOR MEASURING THICKNESS OF MULTILAYER FILM

FILM THICKNESS MEASUREMENT APPARATUS

APPARATUS AND METHOD FOR MEASURING FILM THICKNESS