Kazuhiko Hidaka

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Veenendaal, NL

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Patents Grantslast 30 patents

Information Patent Grant
Method of actuating a system, apparatus for modifying a control sig...
- Patent number 8,606,376
- Issue date Dec 10, 2013
- Mitutoyo Corporation
- Hartmut Illers
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of detecting a movement of a measuring probe and measuring i...
- Patent number 8,345,260
- Issue date Jan 1, 2013
- Mitutoyo Corporation
- Hartmut Illers
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method to determine a control parameter in a measurement control sy...
- Patent number 7,642,503
- Issue date Jan 5, 2010
- Mitutoyo Corporation
- Akinori Saito
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring probe and microscope utilizing the same
- Patent number 7,581,438
- Issue date Sep 1, 2009
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring instrument
- Patent number 7,319,528
- Issue date Jan 15, 2008
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method of actuating a system, apparatus for modifying a control sig...
- Publication number 20110004326
- Publication date Jan 6, 2011
- Mitutoyo Corporation
- Hans-Ulrich Danzebrink
- G01 - MEASURING TESTING
Information Patent Application
Method of detecting a movement of a measuring probe and measuring i...
- Publication number 20100067021
- Publication date Mar 18, 2010
- Mitutoyo Corporation
- Hans-Ullrich Danzebrink
- G01 - MEASURING TESTING
Information Patent Application
Surface texture measuring instrument
- Publication number 20060109480
- Publication date May 25, 2006
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Application
Surface texture measuring probe and microscope utilizing the same
- Publication number 20060090550
- Publication date May 4, 2006
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Application
Control parameter setting method for control circuit in measurement...
- Publication number 20060056548
- Publication date Mar 16, 2006
- Mitutoyo Corporation
- Akinori Saito
- G01 - MEASURING TESTING