Kazuhiko Iwasaki

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Yokohama-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Computer program and computer system for producing test flow
- Patent number 8,271,460
- Issue date Sep 18, 2012
- Silicon Test Technologies. Inc.
- Kazuhiko Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit incorporating test configuration a...
- Patent number 7,702,979
- Issue date Apr 20, 2010
- Semiconductor Technology Academic Research Center
- Masayuki Arai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining optimum initial value for test...
- Patent number 7,299,394
- Issue date Nov 20, 2007
- Semiconductor Technology Academic Research Center
- Ken-ichi Ichino
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
COMPUTER PROGRAM AND COMPUTER SYSTEM FOR PRODUCING TEST FLOW
- Publication number 20110131217
- Publication date Jun 2, 2011
- SILICON TEST TECHNOLOGIES INC.
- Kazuhiko Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit incorporating test configuration a...
- Publication number 20060282730
- Publication date Dec 14, 2006
- Semiconductor Technology Academic Research Center
- Masayuki Arai
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for determining optimum initial value for test...
- Publication number 20040088626
- Publication date May 6, 2004
- Semiconductor Tchnology Academic Research Center
- Ken-ichi Ichino
- G06 - COMPUTING CALCULATING COUNTING