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Kazuhiko Kawasaki

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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    PHASE SHIFT INTERFEROMETER
    • Publication number 20180128593
    • Publication date May 10, 2018
    • MITUTOYO CORPORATION
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    INSTANTANEOUS PHASE-SHIFT INTERFEROMETER
    • Publication number 20170016711
    • Publication date Jan 19, 2017
    • MITUTOYO CORPORATION
    • Kazuhiko KAWASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    LASER FREQUENCY MEASUREMENT METHOD AND DEVICE USING OPTICAL FREQUEN...
    • Publication number 20160011055
    • Publication date Jan 14, 2016
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MICROSCOPE
    • Publication number 20110007324
    • Publication date Jan 13, 2011
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE MICROSCOPE
    • Publication number 20100199393
    • Publication date Aug 5, 2010
    • Mitutoyo Corporation
    • Yoshimasa Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    LIGHTWAVE INTERFEROMETRIC DISTANCE MEASURING METHOD AND APPARATUS
    • Publication number 20100026983
    • Publication date Feb 4, 2010
    • MITUTOYO CORPORATION
    • Kazuhiko KAWASAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    Oblique incidence interferometer
    • Publication number 20100027028
    • Publication date Feb 4, 2010
    • Mitutoyo Corporation
    • Yutaka Kuriyama
    • G01 - MEASURING TESTING
  • Information Patent Application

    IMAGE FORMING APPARATUS
    • Publication number 20090190941
    • Publication date Jul 30, 2009
    • Yasushi Hashimoto
    • G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
  • Information Patent Application

    Shape measuring apparatus
    • Publication number 20090021747
    • Publication date Jan 22, 2009
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Measuring apparatus
    • Publication number 20080047335
    • Publication date Feb 28, 2008
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Oblique incidence interferometer
    • Publication number 20080002212
    • Publication date Jan 3, 2008
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Interferometer and shape measuring method
    • Publication number 20060262320
    • Publication date Nov 23, 2006
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Interferometer and method of calibrating the interferometer
    • Publication number 20060250618
    • Publication date Nov 9, 2006
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Scanning wide-area surface shape analyzer
    • Publication number 20020018216
    • Publication date Feb 14, 2002
    • Mitutoyo Corporation
    • Kazuhiko Kawasaki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Shape measuring apparatus
    • Publication number 20010035961
    • Publication date Nov 1, 2001
    • Mitutoyo Corporation
    • Naoki Mitsutani
    • G01 - MEASURING TESTING