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Kazuhiko KOSHIMIZU
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Beaverton, OR, US
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Patents Grants
last 30 patents
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Patent Grant
Probe apparatus and probe method
Patent number
10,310,010
Issue date
Jun 4, 2019
Tokyo Electron Limited
Muneaki Tamura
G01 - MEASURING TESTING
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Patent Grant
Position accuracy inspecting method, position accuracy inspecting a...
Patent number
10,006,941
Issue date
Jun 26, 2018
Tokyo Electron Limited
Kenta Saiki
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
POSITION ACCURACY INSPECTING METHOD, POSITION ACCURACY INSPECTING A...
Publication number
20170219625
Publication date
Aug 3, 2017
TOKYO ELECTRON LIMITED
Kenta Saiki
G01 - MEASURING TESTING
Information
Patent Application
PROBE APPARATUS AND PROBE METHOD
Publication number
20160161553
Publication date
Jun 9, 2016
TOKYO ELECTRON LIMITED
Muneaki TAMURA
G01 - MEASURING TESTING