Kazuhiko Miki

Person

Round Rock, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Self-biased high speed level shifter circuit
- Patent number 8,736,304
- Issue date May 27, 2014
- International Business Machines Corporation
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital circuit to measure and/or correct duty cycles
- Patent number 7,917,795
- Issue date Mar 29, 2011
- International Business Machines Corporation
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System for automatically selecting intermediate power supply voltag...
- Patent number 7,747,892
- Issue date Jun 29, 2010
- International Business Machines Corporation
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method for controlling operation of microprocessor which performs d...
- Patent number 7,716,516
- Issue date May 11, 2010
- Sony Computer Entertainment Inc.
- Yosuke Muraki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Thermal sensing method and apparatus using existing ESD devices
- Patent number 7,519,498
- Issue date Apr 14, 2009
- International Business Machines Corporation
- David W. Boerstler
- G01 - MEASURING TESTING
Information Patent Grant
System and method automatically selecting intermediate power supply...
- Patent number 7,392,419
- Issue date Jun 24, 2008
- International Business Machines Corporation
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Digital circuit to measure and/or correct duty cycles
- Patent number 7,350,095
- Issue date Mar 25, 2008
- International Business Machines Corporation
- David William Boerstler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Level shifter system and method to minimize duty cycle error due to...
- Patent number 7,265,600
- Issue date Sep 4, 2007
- International Business Machines Corporation
- David W. Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Level shifter apparatus and method for minimizing duty cycle distor...
- Patent number 7,245,172
- Issue date Jul 17, 2007
- International Business Machines Corporation
- David W. Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for measuring and adjusting the duty cycle of...
- Patent number 7,225,092
- Issue date May 29, 2007
- International Business Machines Corporation
- David W. Boerstler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to configure phase-locked loop dividing ratio
- Patent number 7,205,853
- Issue date Apr 17, 2007
- Kabushiki Kaisha Toshiba
- Kazuhiko Miki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Variation tolerant charge leakage correction circuit for phase lock...
- Patent number 7,176,731
- Issue date Feb 13, 2007
- International Business Machines Corporation
- Franklin Manuel Baez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
PLL filter leakage sensor
- Patent number 7,171,318
- Issue date Jan 30, 2007
- International Business Machines Corporation
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
PLL manufacturing test apparatus
- Patent number 7,061,223
- Issue date Jun 13, 2006
- International Business Machines Corporation
- David William Boerstler
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for initializing PLLs and measuring VCO charact...
- Patent number 7,019,572
- Issue date Mar 28, 2006
- Kabushiki Kaisha Toshiba
- Kazuhiko Miki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Lock detectors having a narrow sensitivity range
- Patent number 6,927,635
- Issue date Aug 9, 2005
- Toshiba America Electronic Components, Inc.
- Kazuhiko Miki
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM FOR AUTOMATICALLY SELECTING INTERMEDIATE POWER SUPPLY VOLTAG...
- Publication number 20080143419
- Publication date Jun 19, 2008
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIGITAL CIRCUIT TO MEASURE AND/OR CORRECT DUTY CYCLES
- Publication number 20080111604
- Publication date May 15, 2008
- David William Boerstler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for controlling operation of microprocessor which performs d...
- Publication number 20070300082
- Publication date Dec 27, 2007
- Sony Computer Entertainment Inc.
- Yosuke Muraki
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Level shifter apparatus and method for minimizing duty cycle distor...
- Publication number 20070103215
- Publication date May 10, 2007
- David W. Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Thermal sensing method and apparatus using existing ESD devices
- Publication number 20070075370
- Publication date Apr 5, 2007
- David W. Boerstler
- G01 - MEASURING TESTING
Information Patent Application
Level shifter system and method to minimize duty cycle error due to...
- Publication number 20070075764
- Publication date Apr 5, 2007
- David W. Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Self-biased high speed level shifter circuit
- Publication number 20070008003
- Publication date Jan 11, 2007
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
System and method automatically selecting intermediate power supply...
- Publication number 20070001739
- Publication date Jan 4, 2007
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method to configure phase-locked loop dividing ratio
- Publication number 20060214735
- Publication date Sep 28, 2006
- Kazuhiko Miki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Digital circuit to measure and/or correct duty cycles
- Publication number 20060212739
- Publication date Sep 21, 2006
- David William Boerstler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for measuring and adjusting the duty cycle of...
- Publication number 20060103367
- Publication date May 18, 2006
- International Business Machines Corporation
- David W. Boerstler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Variation tolerant charge leakage correction circuit for phase lock...
- Publication number 20060044030
- Publication date Mar 2, 2006
- International Business Machines Corporation
- Franklin Manuel Baez
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND METHODS FOR INITIALIZING PLLS AND MEASURING VCO CHARACT...
- Publication number 20060017477
- Publication date Jan 26, 2006
- Kazuhiko Miki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PLL filter leakage sensor
- Publication number 20050280406
- Publication date Dec 22, 2005
- International Business Machines Corporation
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOCK DETECTORS HAVING A NARROW SENSITIVITY RANGE
- Publication number 20050046486
- Publication date Mar 3, 2005
- Toshiba America Electronic Components, Inc.
- Kazuhiko Miki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
PLL manufacturing test apparatus
- Publication number 20040263146
- Publication date Dec 30, 2004
- International Business Machines Corporation
- David William Boerstler
- H03 - BASIC ELECTRONIC CIRCUITRY

Kazuhiko Miki

Person

Patents Grantslast 30 patents

Self-biased high speed level shifter circuit

Digital circuit to measure and/or correct duty cycles

System for automatically selecting intermediate power supply voltag...

Method for controlling operation of microprocessor which performs d...

Thermal sensing method and apparatus using existing ESD devices

System and method automatically selecting intermediate power supply...

Digital circuit to measure and/or correct duty cycles

Level shifter system and method to minimize duty cycle error due to...

Level shifter apparatus and method for minimizing duty cycle distor...

Method and apparatus for measuring and adjusting the duty cycle of...

Method to configure phase-locked loop dividing ratio

Variation tolerant charge leakage correction circuit for phase lock...

PLL filter leakage sensor

PLL manufacturing test apparatus

Systems and methods for initializing PLLs and measuring VCO charact...

Lock detectors having a narrow sensitivity range

Patents Applicationslast 30 patents

SYSTEM FOR AUTOMATICALLY SELECTING INTERMEDIATE POWER SUPPLY VOLTAG...

DIGITAL CIRCUIT TO MEASURE AND/OR CORRECT DUTY CYCLES

Method for controlling operation of microprocessor which performs d...

Level shifter apparatus and method for minimizing duty cycle distor...

Thermal sensing method and apparatus using existing ESD devices

Level shifter system and method to minimize duty cycle error due to...

Self-biased high speed level shifter circuit

System and method automatically selecting intermediate power supply...

Method to configure phase-locked loop dividing ratio

Digital circuit to measure and/or correct duty cycles

Method and apparatus for measuring and adjusting the duty cycle of...

Variation tolerant charge leakage correction circuit for phase lock...

SYSTEMS AND METHODS FOR INITIALIZING PLLS AND MEASURING VCO CHARACT...

PLL filter leakage sensor

LOCK DETECTORS HAVING A NARROW SENSITIVITY RANGE

PLL manufacturing test apparatus