Tokyo, JP
Information
Patent Grant
National University Corporation Tokyo University of Agriculture and Technology
Kazuhiko Misawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
National University Corporation Tokyo University of Agriculture and Technology
Takayuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Japan Science and Technology
Kazuhiko Misawa
G01 - MEASURING TESTING
Information
Patent Grant
Japan Science and Technology Agency
Isao Matsuda
G02 - OPTICS
Information
Patent Grant
The University of Tokyo
Takayoshi Kobayashi
G02 - OPTICS
Information
Patent Application
National University Corporation Tokyo University Of Agriculture And Technology
Kazuhiko Misawa
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
Kazuhiko Misawa
G01 - MEASURING TESTING
Information
Patent Application
NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
Kazuhiko Misawa
G01 - MEASURING TESTING
Information
Patent Application
NATIONAL UNIVERSITY CORPORATION TOKYO UNIVERSITY OF AGRICULTURE AND TECHNOLOGY
Takayuki Suzuki
G01 - MEASURING TESTING
Information
Patent Application
Japan Science and Technology Agency
Isao Matsuda
G02 - OPTICS
Information
Patent Application
Japan Science and Technology Agency
Kazuhiko Misawa
G01 - MEASURING TESTING
