Kazuhiko Omote

Person

Akishima-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Transmissive small-angle scattering device
- Patent number 12,019,036
- Issue date Jun 25, 2024
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Imaging type X-ray microscope
- Patent number 11,885,753
- Issue date Jan 30, 2024
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
Total reflection x-ray fluorescence spectrometer
- Patent number 11,867,646
- Issue date Jan 9, 2024
- Rigaku Corporation
- Makoto Kambe
- G01 - MEASURING TESTING
Information Patent Grant
Transmissive small-angle scattering device
- Patent number 11,754,515
- Issue date Sep 12, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Fluorescent X-ray analysis apparatus comprising a plurality of X-ra...
- Patent number 11,733,185
- Issue date Aug 22, 2023
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for fine structure, and apparatus and program thereof
- Patent number 11,408,837
- Issue date Aug 9, 2022
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method for fine structure, apparatus, and program
- Patent number 11,131,637
- Issue date Sep 28, 2021
- Rigaku Corporation
- Yoshiyasu Ito
- G01 - MEASURING TESTING
Information Patent Grant
X-ray inspection device
- Patent number 11,079,345
- Issue date Aug 3, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Grant
Hybrid inspection system
- Patent number 10,983,073
- Issue date Apr 20, 2021
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
Soller slit, X-ray diffraction apparatus, and method
- Patent number 10,964,439
- Issue date Mar 30, 2021
- Rigaku Corporation
- Ladislav Pina
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspecting device, X-ray thin film inspecting method, and met...
- Patent number 10,876,978
- Issue date Dec 29, 2020
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray generator and x-ray analysis device
- Patent number 10,854,348
- Issue date Dec 1, 2020
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
X-ray reflectometer
- Patent number 10,598,616
- Issue date Mar 24, 2020
- Rigaku Corporation
- Satoshi Murakami
- G01 - MEASURING TESTING
Information Patent Grant
X-ray thin film inspection device
- Patent number 10,514,345
- Issue date Dec 24, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray thin film inspection device
- Patent number 10,473,598
- Issue date Nov 12, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer with multilayer reflection-type monochromator
- Patent number 10,436,723
- Issue date Oct 8, 2019
- Rigaku Corporation
- Takeshi Osakabe
- G01 - MEASURING TESTING
Information Patent Grant
X-ray small angle optical system
- Patent number 10,429,325
- Issue date Oct 1, 2019
- Rigaku Corporation
- Kazuki Ito
- G01 - MEASURING TESTING
Information Patent Grant
Grazing incidence x-ray fluorescence spectrometer and grazing incid...
- Patent number 10,302,579
- Issue date May 28, 2019
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Beam generation unit and X-ray small-angle scattering apparatus
- Patent number 10,145,808
- Issue date Dec 4, 2018
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray topography apparatus
- Patent number 9,658,174
- Issue date May 23, 2017
- Rigaku Corporation
- Kazuhiko Omote
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray topography apparatus
- Patent number 9,335,282
- Issue date May 10, 2016
- Rigaku Corporation
- Kazuhiko Omote
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray apparatus, method of using the same and X-ray irradiation method
- Patent number 9,336,917
- Issue date May 10, 2016
- Rigaku Corporation
- Tetsuya Ozawa
- B82 - NANO-TECHNOLOGY
Information Patent Grant
X-ray imaging apparatus, and X-ray imaging method
- Patent number 9,250,199
- Issue date Feb 2, 2016
- Rigaku Corporation
- Kazuhiko Omote
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
X-ray generating apparatus
- Patent number 9,159,524
- Issue date Oct 13, 2015
- Rigaku Corporation
- Martin Horvarth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
X-ray intensity correction method and X-ray diffractometer
- Patent number 9,086,367
- Issue date Jul 21, 2015
- Rigaku Corporation
- Toru Mitsunaga
- G01 - MEASURING TESTING
Information Patent Grant
Target for X-ray generator, method of manufacturing the same and X-...
- Patent number 9,020,101
- Issue date Apr 28, 2015
- Rigaku Corporation
- Kazuhiko Omote
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Surface microstructure measurement method, surface microstructure m...
- Patent number 8,908,830
- Issue date Dec 9, 2014
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
X-ray scattering measurement device and X-ray scattering measuremen...
- Patent number 8,767,918
- Issue date Jul 1, 2014
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Grant
Motion control system and X-ray measurement apparatus
- Patent number 8,712,013
- Issue date Apr 29, 2014
- Rigaku Corporation
- Tetsuo Kani
- G05 - CONTROLLING REGULATING
Information Patent Grant
X-ray image photographing method and X-ray image photographing appa...
- Patent number 8,699,663
- Issue date Apr 15, 2014
- Rigaku Corporation
- Kazuhiko Omote
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR CALCULATING A...
- Publication number 20240120036
- Publication date Apr 11, 2024
- Rigaku Corporation
- Masatsugu YOSHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20230400423
- Publication date Dec 14, 2023
- Rigaku Corporation
- Makoto KAMBE
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230384248
- Publication date Nov 30, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20230375485
- Publication date Nov 23, 2023
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
DAMAGE MEASUREMENT METHOD, APPARATUS AND PROGRAM, AND X-RAY DIFFRAC...
- Publication number 20230304948
- Publication date Sep 28, 2023
- Rigaku Corporation
- Ryouichi YOKOYAMA
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE
- Publication number 20220170869
- Publication date Jun 2, 2022
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
IMAGING TYPE X-RAY MICROSCOPE
- Publication number 20220128487
- Publication date Apr 28, 2022
- Rigaku Corporation
- Kazuhiko OMOTE
- G01 - MEASURING TESTING
Information Patent Application
Scattering Measurement Analysis Method, Scattering Measurement Anal...
- Publication number 20210200922
- Publication date Jul 1, 2021
- Rigaku Corporation
- Tomoyuki IWATA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FLUORESCENT X-RAY ANALYSIS APPARATUS
- Publication number 20210116399
- Publication date Apr 22, 2021
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE
- Publication number 20210063326
- Publication date Mar 4, 2021
- Rigaku Corporation
- Naoki Matsushima
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD FOR FINE STRUCTURE, APPARATUS, AND PROGRAM
- Publication number 20200333268
- Publication date Oct 22, 2020
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS METHOD FOR FINE STRUCTURE, AND APPARATUS AND PROGRAM THEREOF
- Publication number 20200333267
- Publication date Oct 22, 2020
- Rigaku Corporation
- Yoshiyasu ITO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY REFLECTOMETER
- Publication number 20190277781
- Publication date Sep 12, 2019
- Rigaku Corporation
- Satoshi Murakami
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE
- Publication number 20190272929
- Publication date Sep 5, 2019
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
HYBRID INSPECTION SYSTEM
- Publication number 20190227006
- Publication date Jul 25, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND MET...
- Publication number 20190227005
- Publication date Jul 25, 2019
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
SOLLER SLIT, X-RAY DIFFRACTION APPARATUS, AND METHOD
- Publication number 20190122782
- Publication date Apr 25, 2019
- Rigaku Corporation
- LADISLAV PINA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY THIN FILM INSPECTION DEVICE
- Publication number 20170299528
- Publication date Oct 19, 2017
- Rigaku Corporation
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
GRAZING INCIDENCE X-RAY FLUORESCENCE SPECTROMETER AND GRAZING INCID...
- Publication number 20170284949
- Publication date Oct 5, 2017
- Rigaku Corporation
- Kazuhiko OMOTE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY THIN FILM INSPECTION DEVICE
- Publication number 20170234814
- Publication date Aug 17, 2017
- RIGAKU CORPORATION
- Kiyoshi Ogata
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTOMETER
- Publication number 20170191950
- Publication date Jul 6, 2017
- Rigaku Corporation
- Takeshi OSAKABE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SMALL ANGLE OPTICAL SYSTEM
- Publication number 20170074809
- Publication date Mar 16, 2017
- Rigaku Corporation
- Kazuki ITO
- G01 - MEASURING TESTING
Information Patent Application
BEAM GENERATION UNIT AND X-RAY SMALL-ANGLE SCATTERING APPARATUS
- Publication number 20170010226
- Publication date Jan 12, 2017
- Rigaku Corporation
- Kazuhiko Omote
- G01 - MEASURING TESTING
Information Patent Application
X-RAY TOPOGRAPHY APPARATUS
- Publication number 20150146858
- Publication date May 28, 2015
- Rigaku Corporation
- Kazuhiko OMOTE
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATING APPARATUS
- Publication number 20140105367
- Publication date Apr 17, 2014
- Rigaku Corporation
- Martin HORVARTH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY IMAGING APPARATUS, AND X-RAY IMAGING METHOD
- Publication number 20140003578
- Publication date Jan 2, 2014
- Kazuhiko OMOTE
- G01 - MEASURING TESTING
Information Patent Application
TARGET FOR X-RAY GENERATOR, METHOD OF MANUFACTURING THE SAME AND X-...
- Publication number 20130259207
- Publication date Oct 3, 2013
- Rigaku Corporation
- Kazuhiko OMOTE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
X-RAY TOPOGRAPHY APPARATUS
- Publication number 20130259200
- Publication date Oct 3, 2013
- Rigaku Corporation
- Kazuhiko OMOTE
- B82 - NANO-TECHNOLOGY
Information Patent Application
X-RAY INTENSITY CORRECTION METHOD AND X-RAY DIFFRACTOMETER
- Publication number 20130121460
- Publication date May 16, 2013
- Rigaku Corporation
- Toru MITSUNAGA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGE PHOTOGRAPHING METHOD AND X-RAY IMAGE PHOTOGRAPHING APPA...
- Publication number 20120087470
- Publication date Apr 12, 2012
- Rigaku Corporation
- Kazuhiko OMOTE
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Kazuhiko Omote

Person

Patents Grantslast 30 patents

Transmissive small-angle scattering device

Imaging type X-ray microscope

Total reflection x-ray fluorescence spectrometer

Transmissive small-angle scattering device

Fluorescent X-ray analysis apparatus comprising a plurality of X-ra...

Analysis method for fine structure, and apparatus and program thereof

Analysis method for fine structure, apparatus, and program

X-ray inspection device

Hybrid inspection system

Soller slit, X-ray diffraction apparatus, and method

X-ray inspecting device, X-ray thin film inspecting method, and met...

X-ray generator and x-ray analysis device

X-ray reflectometer

X-ray thin film inspection device

X-ray thin film inspection device

X-ray diffractometer with multilayer reflection-type monochromator

X-ray small angle optical system

Grazing incidence x-ray fluorescence spectrometer and grazing incid...

Beam generation unit and X-ray small-angle scattering apparatus

X-ray topography apparatus

X-ray topography apparatus

X-ray apparatus, method of using the same and X-ray irradiation method

X-ray imaging apparatus, and X-ray imaging method

X-ray generating apparatus

X-ray intensity correction method and X-ray diffractometer

Target for X-ray generator, method of manufacturing the same and X-...

Surface microstructure measurement method, surface microstructure m...

X-ray scattering measurement device and X-ray scattering measuremen...

Motion control system and X-ray measurement apparatus

X-ray image photographing method and X-ray image photographing appa...

Patents Applicationslast 30 patents

PROCESSING APPARATUS, SYSTEM, METHOD, AND PROGRAM FOR CALCULATING A...

TOTAL REFLECTION X-RAY FLUORESCENCE SPECTROMETER

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

DAMAGE MEASUREMENT METHOD, APPARATUS AND PROGRAM, AND X-RAY DIFFRAC...

TRANSMISSIVE SMALL-ANGLE SCATTERING DEVICE

IMAGING TYPE X-RAY MICROSCOPE

Scattering Measurement Analysis Method, Scattering Measurement Anal...

FLUORESCENT X-RAY ANALYSIS APPARATUS

X-RAY INSPECTION DEVICE

ANALYSIS METHOD FOR FINE STRUCTURE, APPARATUS, AND PROGRAM

ANALYSIS METHOD FOR FINE STRUCTURE, AND APPARATUS AND PROGRAM THEREOF

X-RAY REFLECTOMETER

X-RAY GENERATOR AND X-RAY ANALYSIS DEVICE

HYBRID INSPECTION SYSTEM

X-RAY INSPECTING DEVICE, X-RAY THIN FILM INSPECTING METHOD, AND MET...

SOLLER SLIT, X-RAY DIFFRACTION APPARATUS, AND METHOD

X-RAY THIN FILM INSPECTION DEVICE

GRAZING INCIDENCE X-RAY FLUORESCENCE SPECTROMETER AND GRAZING INCID...

X-RAY THIN FILM INSPECTION DEVICE

X-RAY DIFFRACTOMETER

X-RAY SMALL ANGLE OPTICAL SYSTEM

BEAM GENERATION UNIT AND X-RAY SMALL-ANGLE SCATTERING APPARATUS

X-RAY TOPOGRAPHY APPARATUS

X-RAY GENERATING APPARATUS

X-RAY IMAGING APPARATUS, AND X-RAY IMAGING METHOD

TARGET FOR X-RAY GENERATOR, METHOD OF MANUFACTURING THE SAME AND X-...

X-RAY TOPOGRAPHY APPARATUS

X-RAY INTENSITY CORRECTION METHOD AND X-RAY DIFFRACTOMETER

X-RAY IMAGE PHOTOGRAPHING METHOD AND X-RAY IMAGE PHOTOGRAPHING APPA...