Kazuhiro Hotta

Person

Hamamatsu-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image processing method, image processing system, and storage mediu...
- Patent number 9,734,571
- Issue date Aug 15, 2017
- Hamamatsu Photonics K.K.
- Kazuhiro Hotta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing method, image processing system, and storage mediu...
- Patent number 9,536,300
- Issue date Jan 3, 2017
- Hamamatsu Photonics K.K.
- Kazuhiro Hotta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor failure analysis apparatus which acquires a failure o...
- Patent number 7,865,012
- Issue date Jan 4, 2011
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis apparatus, failure analysis method,...
- Patent number 7,805,691
- Issue date Sep 28, 2010
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis apparatus, failure analysis method,...
- Patent number 7,752,594
- Issue date Jul 6, 2010
- Hamamatsu Photonics K.K.
- Masahiro Takeda
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE PROCESSING METHOD, IMAGE PROCESSING SYSTEM, AND STORAGE MEDIU...
- Publication number 20150187058
- Publication date Jul 2, 2015
- HAMAMATSU PHOTONICS K. K.
- Kazuhiro HOTTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING METHOD, IMAGE PROCESSING SYSTEM, AND STORAGE MEDIU...
- Publication number 20150187059
- Publication date Jul 2, 2015
- HAMAMATSU PHOTONICS K. K.
- Kazuhiro HOTTA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070294053
- Publication date Dec 20, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070292018
- Publication date Dec 20, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070290696
- Publication date Dec 20, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070020781
- Publication date Jan 25, 2007
- Hamamatsu Photonics K.K.
- Toshiyuki Majima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor failure analysis apparatus, failure analysis method,...
- Publication number 20070011519
- Publication date Jan 11, 2007
- Hamamatsu Photonics K.K.
- Masahiro Takeda
- G06 - COMPUTING CALCULATING COUNTING

Kazuhiro Hotta

Person

Patents Grantslast 30 patents

Image processing method, image processing system, and storage mediu...

Image processing method, image processing system, and storage mediu...

Semiconductor failure analysis apparatus which acquires a failure o...

Semiconductor failure analysis apparatus, failure analysis method,...

Semiconductor failure analysis apparatus, failure analysis method,...

Patents Applicationslast 30 patents

IMAGE PROCESSING METHOD, IMAGE PROCESSING SYSTEM, AND STORAGE MEDIU...

IMAGE PROCESSING METHOD, IMAGE PROCESSING SYSTEM, AND STORAGE MEDIU...

Semiconductor failure analysis apparatus, failure analysis method,...

Semiconductor failure analysis apparatus, failure analysis method,...

Semiconductor failure analysis apparatus, failure analysis method,...

Semiconductor failure analysis apparatus, failure analysis method,...

Semiconductor failure analysis apparatus, failure analysis method,...