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Kazuhiro IEZUMI
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Tokyo, JP
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Patents Grants
last 30 patents
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Patent Grant
Test apparatus and test method
Patent number
11,137,446
Issue date
Oct 5, 2021
Advantest Corporation
Shuichi Inage
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Test system
Patent number
11,057,291
Issue date
Jul 6, 2021
Advantest Corporation
Yoshiyuki Aoki
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Patents Applications
last 30 patents
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Patent Application
TEST SYSTEM
Publication number
20200280505
Publication date
Sep 3, 2020
Advantest Corporation
Yoshiyuki AOKI
H04 - ELECTRIC COMMUNICATION TECHNIQUE
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Patent Application
TEST APPARATUS AND TEST METHOD
Publication number
20200225286
Publication date
Jul 16, 2020
Advantest Corporation
Shuichi INAGE
G01 - MEASURING TESTING