Kazuhiro Jyouo

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Kudamatsu, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor fabricating apparatus with function of determining et...
- Patent number 8,071,397
- Issue date Dec 6, 2011
- Hitachi High-Technologies Corporation
- Tatehito Usui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor fabricating apparatus with function of determining et...
- Patent number 7,259,866
- Issue date Aug 21, 2007
- Hitachi High-Technologies Corporation
- Tatehito Usui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor fabricating apparatus with function of determining et...
- Patent number 6,972,848
- Issue date Dec 6, 2005
- Hitach High-Technologies Corporation
- Tatehito Usui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of and apparatus for detecting an end point of plasma treatment
- Patent number 4,615,761
- Issue date Oct 7, 1986
- Hitachi, Ltd.
- Keiji Tada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR FABRICATING APPARATUS WITH FUNCTION OF DETERMINING ET...
- Publication number 20080020495
- Publication date Jan 24, 2008
- Tatehito Usui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor fabricating apparatus with function of determining et...
- Publication number 20060077397
- Publication date Apr 13, 2006
- Tatehito Usui
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor fabricating apparatus with function of determining et...
- Publication number 20040174530
- Publication date Sep 9, 2004
- Tatehito Usui
- H01 - BASIC ELECTRIC ELEMENTS