Kazuhiro KOIZUMI

Person

Sagamihara-city, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Generation source analyzing device and generation source analyzing...
- Patent number 11,022,534
- Issue date Jun 1, 2021
- Fuji Electric Co., Ltd.
- Naoki Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Gas analyzing apparatus
- Patent number 10,677,719
- Issue date Jun 9, 2020
- FUJI ELECTRIC CO., LTD.
- Yu Taniguchi
- G01 - MEASURING TESTING
Information Patent Grant
Analyzing apparatus and exhaust gas treating system
- Patent number 10,378,416
- Issue date Aug 13, 2019
- Fuji Electric Co., Ltd.
- Ryoichi Higashi
- G01 - MEASURING TESTING
Information Patent Grant
Water quality analyzer
- Patent number 10,302,564
- Issue date May 28, 2019
- Fuji Electric Co., Ltd.
- Yoshiki Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Generation source analyzing device and generation source analyzing...
- Patent number 10,302,610
- Issue date May 28, 2019
- Fuji Electric Co., Ltd.
- Naoki Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Microparticle composition analyzing apparatus
- Patent number 10,283,337
- Issue date May 7, 2019
- Fuji Electric Co., Ltd.
- Naoki Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Signal processing device and noise strength determining method
- Patent number 10,061,034
- Issue date Aug 28, 2018
- FUJI ELECTRIC CO., LTD.
- Yasuyuki Masunaga
- G01 - MEASURING TESTING
Information Patent Grant
Multifunctional particle analysis device and method of calibrating...
- Patent number 10,012,628
- Issue date Jul 3, 2018
- Fuji Electric Co., Ltd.
- Yoshiki Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing device and radiation measurement device
- Patent number 9,983,317
- Issue date May 29, 2018
- Fuji Electric Co., Ltd.
- Yasuyuki Masunaga
- G01 - MEASURING TESTING
Information Patent Grant
Particle analyzing apparatus
- Patent number 9,857,282
- Issue date Jan 2, 2018
- Fuji Electric Co., Ltd.
- Yoshiki Hasegawa
- G01 - MEASURING TESTING
Information Patent Grant
Particle detection device
- Patent number 9,851,292
- Issue date Dec 26, 2017
- Fuji Electric Co., Ltd.
- Masaya Tabaru
- G01 - MEASURING TESTING
Information Patent Grant
Particle measuring device
- Patent number 9,671,325
- Issue date Jun 6, 2017
- Fuji Electric Co., Ltd.
- Naoki Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam forming device
- Patent number 9,574,984
- Issue date Feb 21, 2017
- Fuji Electric Co., Ltd.
- Naoki Takeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laser-type gas analyzer
- Patent number 9,310,295
- Issue date Apr 12, 2016
- Fuji Electric Co., Ltd.
- Masaya Tabaru
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
GAS ANALYZING APPARATUS
- Publication number 20190195784
- Publication date Jun 27, 2019
- Fuji Electric Co., Ltd.
- Yu TANIGUCHI
- G02 - OPTICS
Information Patent Application
GENERATION SOURCE ANALYZING DEVICE AND GENERATION SOURCE ANALYZING...
- Publication number 20180292302
- Publication date Oct 11, 2018
- Fuji Electric Co., Ltd.
- Naoki TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
WATER QUALITY ANALYZER
- Publication number 20180246035
- Publication date Aug 30, 2018
- Fuji Electric Co., Ltd.
- Yoshiki Hasegawa
- G01 - MEASURING TESTING
Information Patent Application
GENERATION SOURCE ANALYZING DEVICE AND GENERATION SOURCE ANALYZING...
- Publication number 20170315105
- Publication date Nov 2, 2017
- Fuji Electric Co., Ltd.
- Naoki TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE COMPONENT ANALYZING DEVICE, PARTICLE MULTIPLE-ANALYZING DE...
- Publication number 20170292903
- Publication date Oct 12, 2017
- Fuji Electric Co., Ltd.
- Yoshiki HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE ANALYZING APPARATUS
- Publication number 20170212030
- Publication date Jul 27, 2017
- Fuji Electric Co., Ltd.
- Yoshiki HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
TRAP REPLACEMENT MECHANISM AND MICROPARTICLE COMPOSITION ANALYZING...
- Publication number 20170154762
- Publication date Jun 1, 2017
- Fuji Electric Co., Ltd.
- Naoki TAKEDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MICROPARTICLE COMPOSITION ANALYZING APPARATUS
- Publication number 20170069476
- Publication date Mar 9, 2017
- Fuji Electric Co., Ltd.
- Naoki TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING DEVICE AND RADIATION MEASUREMENT DEVICE
- Publication number 20170059718
- Publication date Mar 2, 2017
- Fuji Electric Co., Ltd.
- Yasuyuki MASUNAGA
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE DETECTION DEVICE
- Publication number 20170016820
- Publication date Jan 19, 2017
- Fuji Electric Co., Ltd.
- Masaya TABARU
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE MEASURING DEVICE
- Publication number 20170003221
- Publication date Jan 5, 2017
- Fuji Electric Co., Ltd.
- Naoki TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
MULTIFUNCTIONAL PARTICLE ANALYSIS DEVICE AND METHOD OF CALIBRATING...
- Publication number 20160377539
- Publication date Dec 29, 2016
- Fuji Electric Co., Ltd.
- Yoshiki HASEGAWA
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING DEVICE AND NOISE STRENGTH DETERMINING METHOD
- Publication number 20160356896
- Publication date Dec 8, 2016
- Fuji Electric Co., Ltd.
- Yasuyuki MASUNAGA
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING APPARATUS AND EXHAUST GAS TREATING SYSTEM
- Publication number 20160348561
- Publication date Dec 1, 2016
- Fuji Electric Co., Ltd.
- Ryoichi HIGASHI
- G01 - MEASURING TESTING
Information Patent Application
LASER-TYPE GAS ANALYZER
- Publication number 20150268159
- Publication date Sep 24, 2015
- Fuji Electric Co., Ltd.
- Masaya TABARU
- G01 - MEASURING TESTING
Information Patent Application
PARTICLE BEAM FORMING DEVICE
- Publication number 20150260629
- Publication date Sep 17, 2015
- The University of Tokyo
- Naoki Takeda
- G01 - MEASURING TESTING

Kazuhiro KOIZUMI

Person

Patents Grantslast 30 patents

Generation source analyzing device and generation source analyzing...

Gas analyzing apparatus

Analyzing apparatus and exhaust gas treating system

Water quality analyzer

Generation source analyzing device and generation source analyzing...

Microparticle composition analyzing apparatus

Signal processing device and noise strength determining method

Multifunctional particle analysis device and method of calibrating...

Signal processing device and radiation measurement device

Particle analyzing apparatus

Particle detection device

Particle measuring device

Particle beam forming device

Laser-type gas analyzer

Patents Applicationslast 30 patents

GAS ANALYZING APPARATUS

GENERATION SOURCE ANALYZING DEVICE AND GENERATION SOURCE ANALYZING...

WATER QUALITY ANALYZER

GENERATION SOURCE ANALYZING DEVICE AND GENERATION SOURCE ANALYZING...

PARTICLE COMPONENT ANALYZING DEVICE, PARTICLE MULTIPLE-ANALYZING DE...

PARTICLE ANALYZING APPARATUS

TRAP REPLACEMENT MECHANISM AND MICROPARTICLE COMPOSITION ANALYZING...

MICROPARTICLE COMPOSITION ANALYZING APPARATUS

SIGNAL PROCESSING DEVICE AND RADIATION MEASUREMENT DEVICE

PARTICLE DETECTION DEVICE

PARTICLE MEASURING DEVICE

MULTIFUNCTIONAL PARTICLE ANALYSIS DEVICE AND METHOD OF CALIBRATING...

SIGNAL PROCESSING DEVICE AND NOISE STRENGTH DETERMINING METHOD

ANALYZING APPARATUS AND EXHAUST GAS TREATING SYSTEM

LASER-TYPE GAS ANALYZER

PARTICLE BEAM FORMING DEVICE