Kazuhiro Miyakawa

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface inspection method and surface inspection device
- Patent number 7,477,373
- Issue date Jan 13, 2009
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Particle monitoring apparatus and vacuum processing apparatus
- Patent number 7,417,732
- Issue date Aug 26, 2008
- Kabushiki Kaisha Topcon
- Yoichiro Iwa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 7,348,585
- Issue date Mar 25, 2008
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection method and surface inspection apparatus
- Patent number 7,245,366
- Issue date Jul 17, 2007
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection apparatus
- Patent number 7,227,649
- Issue date Jun 5, 2007
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Method for inspecting surface and apparatus for inspecting it
- Patent number 7,154,597
- Issue date Dec 26, 2006
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Grant
Noncontact tonometer capable of measuring intraocular tension by op...
- Patent number 6,120,444
- Issue date Sep 19, 2000
- Kabushiki Kaisha Topcon
- Kazuhiro Miyakawa
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
INTERFERENCE MICROSCOPE AND MEASURING APPARATUS
- Publication number 20120120485
- Publication date May 17, 2012
- KABUSHIKI KAISHA TOPCON
- Fumio Ootomo
- G02 - OPTICS
Information Patent Application
Surface inspection method and surface inspection device
- Publication number 20070229813
- Publication date Oct 4, 2007
- Kabushiki Kaisha TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Particle monitoring apparatus and vacuum processing apparatus
- Publication number 20060132769
- Publication date Jun 22, 2006
- Kabushiki Kaisha TOPCON
- Yoichiro Iwa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus
- Publication number 20060103856
- Publication date May 18, 2006
- Kabushiki Kaisha TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus
- Publication number 20050270522
- Publication date Dec 8, 2005
- Kabushiki Kaisha TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Method for inspecting surface and apparatus for inspecting it
- Publication number 20040263835
- Publication date Dec 30, 2004
- KABUSHIKI KAISHA TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection method and surface inspection apparatus
- Publication number 20040252295
- Publication date Dec 16, 2004
- KABUSHIKI KAISHA TOPCON
- Kazuhiro Miyakawa
- G01 - MEASURING TESTING
Information Patent Application
Surface inspection apparatus
- Publication number 20040169853
- Publication date Sep 2, 2004
- Yoichiro Iwa
- G01 - MEASURING TESTING
Information Patent Application
Laser light source device and surface inspection apparatus using it
- Publication number 20040095572
- Publication date May 20, 2004
- KABUSHIKI KAISHA TOPCON
- Yoichiro Iwa
- G02 - OPTICS

Kazuhiro Miyakawa

Person

Patents Grantslast 30 patents

Surface inspection method and surface inspection device

Particle monitoring apparatus and vacuum processing apparatus

Surface inspection apparatus

Surface inspection method and surface inspection apparatus

Surface inspection apparatus

Method for inspecting surface and apparatus for inspecting it

Noncontact tonometer capable of measuring intraocular tension by op...

Patents Applicationslast 30 patents

INTERFERENCE MICROSCOPE AND MEASURING APPARATUS

Surface inspection method and surface inspection device

Particle monitoring apparatus and vacuum processing apparatus

Surface inspection apparatus

Surface inspection apparatus

Method for inspecting surface and apparatus for inspecting it

Surface inspection method and surface inspection apparatus

Surface inspection apparatus

Laser light source device and surface inspection apparatus using it