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Kazuhiro Monden
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Hiroshima, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Sensor for inspection instrument and inspection instrument
Patent number
7,173,445
Issue date
Feb 6, 2007
OHT Inc.
Tatsuhisa Fujii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Tester and testing method
Publication number
20040243345
Publication date
Dec 2, 2004
OHT INC.
Tatsuhisa Fujii
G01 - MEASURING TESTING
Information
Patent Application
Tester and testing method
Publication number
20040240724
Publication date
Dec 2, 2004
Tatsuhisa Fujii
G01 - MEASURING TESTING
Information
Patent Application
Sensor for inspection instrument and inspection instrument
Publication number
20040241887
Publication date
Dec 2, 2004
Tatsuhisa Fujii
G01 - MEASURING TESTING
Information
Patent Application
Circuit wiring inspetion instrument and circuit wiring inspecting m...
Publication number
20040234121
Publication date
Nov 25, 2004
Tatsuhisa Fujii
G01 - MEASURING TESTING