Kazuhiro Nagaike

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Field-effect transistor, single-electron transistor and sensor usin...
- Patent number 9,506,892
- Issue date Nov 29, 2016
- Japan Science and Technology Agency
- Kazuhiko Matsumoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method of use of a field-effect transistor, single-electron transis...
- Patent number 8,772,099
- Issue date Jul 8, 2014
- Japan Science and Technology Agency
- Kazuhiko Matsumoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Field-effect transistor, single-electron transistor and sensor
- Patent number 8,766,326
- Issue date Jul 1, 2014
- Japan Science and Technology Agency
- Kazuhiko Matsumoto
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Field-effect transistor, single-electron transistor and sensor usin...
- Patent number 8,502,277
- Issue date Aug 6, 2013
- Japan Science and Technology Agency
- Kazuhiko Matsumoto
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
FIELD-EFFECT TRANSISTOR, SINGLE-ELECTRON TRANSISTOR AND SENSOR USIN...
- Publication number 20150102283
- Publication date Apr 16, 2015
- Japan Science and Technology Agency
- Kazuhiko Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
FIELD-EFFECT TRANSISTOR, SINGLE-ELECTRON TRANSISTOR AND SENSOR
- Publication number 20120286243
- Publication date Nov 15, 2012
- Japan Science and Technology Agency
- Kazuhiko Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF USE OF A FIELD-EFFECT TRANSISTOR, SINGLE-ELECTRON TRANSIS...
- Publication number 20120286763
- Publication date Nov 15, 2012
- Japan Science and Technology Agency
- Kazuhiko Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Field-effect transistor, single-electron transistor and sensor usin...
- Publication number 20070063304
- Publication date Mar 22, 2007
- Kazuhiko Matsumoto
- G01 - MEASURING TESTING
Information Patent Application
Surface plasmon resonance sensor chip and sample analysis method an...
- Publication number 20040155309
- Publication date Aug 12, 2004
- Takaaki Sorin
- G01 - MEASURING TESTING