Kazuhiro Nakajima

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device having universal logic cell
- Patent number 7,205,795
- Issue date Apr 17, 2007
- NEC Electronics Corporation
- Masaharu Mizuno
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test method and apparatus for verifying fabrication of transistors...
- Patent number 6,958,659
- Issue date Oct 25, 2005
- NEC Electronics Corporation
- Kazuhiro Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Universal logic module and ASIC using the same
- Patent number 6,946,875
- Issue date Sep 20, 2005
- NEC Electronics Corporation
- Kenji Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Phase comparator
- Patent number 6,801,094
- Issue date Oct 5, 2004
- NEC Electronics Corporation
- Tomonari Aoki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Clock signal distribution circuit
- Patent number 6,696,863
- Issue date Feb 24, 2004
- NEC Electronics Corporation
- Kenji Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of designing signal distribution circuit and system for supp...
- Patent number 6,557,152
- Issue date Apr 29, 2003
- NEC Electronics Corporation
- Kazuhiro Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of designing semiconductor device, and method of manufacturi...
- Patent number 6,493,860
- Issue date Dec 10, 2002
- NEC Corporation
- Kazuhiro Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical isolator
- Patent number 5,267,078
- Issue date Nov 30, 1993
- Shiraishi; Kazuo
- Kazuo Shiraishi
- G02 - OPTICS

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor device having universal logic cell
- Publication number 20050218936
- Publication date Oct 6, 2005
- NEC Electronics Corporation
- Masaharu Mizuno
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Production process for producing semiconductor devices, semiconduct...
- Publication number 20050098779
- Publication date May 12, 2005
- NEC ELECTRONICS CORPORATION
- Kazuhiro Nakajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test method and apparatus for verifying fabrication of transistors...
- Publication number 20040041641
- Publication date Mar 4, 2004
- NEC Electronics Corporation
- Kazuhiro Nakajima
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Phase comparator
- Publication number 20030151463
- Publication date Aug 14, 2003
- Tomonari Aoki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Universal logic module and ASIC using the same
- Publication number 20030117169
- Publication date Jun 26, 2003
- Kenji Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Semiconductor integrated circuit design method
- Publication number 20030056185
- Publication date Mar 20, 2003
- NEC Corporation
- Kazuhiro Nakajima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Clock signal distribution circuit
- Publication number 20030052724
- Publication date Mar 20, 2003
- NEC Corporation
- Kenji Yamamoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method of designing semiconductor device and method of manufacturin...
- Publication number 20020002699
- Publication date Jan 3, 2002
- NEC Corporation
- Kazuhiro Nakajima
- G06 - COMPUTING CALCULATING COUNTING

Kazuhiro Nakajima

Person

Patents Grantslast 30 patents

Semiconductor device having universal logic cell

Test method and apparatus for verifying fabrication of transistors...

Universal logic module and ASIC using the same

Phase comparator

Clock signal distribution circuit

Method of designing signal distribution circuit and system for supp...

Method of designing semiconductor device, and method of manufacturi...

Optical isolator

Patents Applicationslast 30 patents

Semiconductor device having universal logic cell

Production process for producing semiconductor devices, semiconduct...

Test method and apparatus for verifying fabrication of transistors...

Phase comparator

Universal logic module and ASIC using the same

Semiconductor integrated circuit design method

Clock signal distribution circuit

Method of designing semiconductor device and method of manufacturin...