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Kazuhiro Nakamura

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  • Tochigi-ken, JP
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Patents Grantslast 30 patents

  • Information Patent Grant

    Electronic device
    • Patent number 11,537,170
    • Issue date Dec 27, 2022
    • Dynabook Inc.
    • Takehiro Hori
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Grant

    Automatic analyzer and method for washing sample-pipetting probe
    • Patent number 11,480,504
    • Issue date Oct 25, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Pressure vessel and method for winding filament
    • Patent number 11,384,902
    • Issue date Jul 12, 2022
    • Yachiyo Industry Co., Ltd.
    • Yoshihiro Watanabe
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Grant

    Oxygen detecting agent composition, and molded article, sheet, pack...
    • Patent number 10,989,666
    • Issue date Apr 27, 2021
    • Mitsubishi Gas Chemical Company, Inc.
    • Kazuhiro Nakamura
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzing apparatus
    • Patent number 10,761,105
    • Issue date Sep 1, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Yoshiki Muramatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,732,192
    • Issue date Aug 4, 2020
    • HITACHI HIGH-TECH CORPORATION
    • Satoru Chida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzing device
    • Patent number 10,422,808
    • Issue date Sep 24, 2019
    • Hitachi High-Technologies Corporation
    • Hiroyuki Takayama
    • B08 - CLEANING
  • Information Patent Grant

    Automated analyzer device
    • Patent number 10,302,668
    • Issue date May 28, 2019
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzing apparatus
    • Patent number 10,145,858
    • Issue date Dec 4, 2018
    • Hitachi High-Technologies Corporation
    • Kenichi Hirami
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,094,844
    • Issue date Oct 9, 2018
    • Hitachi High-Technologies Corporation
    • Yoshiaki Saito
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,067,152
    • Issue date Sep 4, 2018
    • Hitachi High-Technologies Corporation
    • Masaru Miyazaki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 10,031,152
    • Issue date Jul 24, 2018
    • Hitachi High-Technologies Corporation
    • Yoshiki Muramatsu
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Seal structure for fuel tank
    • Patent number 10,011,167
    • Issue date Jul 3, 2018
    • Yachiyo Industry Co., Ltd.
    • Kazuhiro Nakamura
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Automatic analysis device
    • Patent number 9,945,881
    • Issue date Apr 17, 2018
    • Hitachi High-Technologies Corporation
    • Yoshiaki Saito
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Grant

    Automatic analyzing device
    • Patent number 9,933,447
    • Issue date Apr 3, 2018
    • Hitachi High-Technologies Corporation
    • Hiroyuki Takayama
    • B08 - CLEANING
  • Information Patent Grant

    Pressure container
    • Patent number 9,920,881
    • Issue date Mar 20, 2018
    • Yachiyo Industry Co., Ltd.
    • Kazuhiro Nakamura
    • F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
  • Information Patent Grant

    Automatic analyzer and method for washing sample-pipetting probe
    • Patent number 9,897,519
    • Issue date Feb 20, 2018
    • Hitachi High-Technologies Corporation
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analysis device
    • Patent number 9,891,241
    • Issue date Feb 13, 2018
    • Hitachi High-Technologies Corporation
    • Takamichi Mori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automated analyzer
    • Patent number 9,846,170
    • Issue date Dec 19, 2017
    • Hitachi High-Technologies Corporation
    • Takenori Okusa
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,772,264
    • Issue date Sep 26, 2017
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Oxygen detecting agent composition, and molded article, sheet, pack...
    • Patent number 9,772,316
    • Issue date Sep 26, 2017
    • Mitsubishi Gas Chemical Company, Inc.
    • Kazuhiro Nakamura
    • B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
  • Information Patent Grant

    Automatic analyzer
    • Patent number 9,709,586
    • Issue date Jul 18, 2017
    • Hitachi High-Technologies Corporation
    • Takamichi Mori
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analytical device and method
    • Patent number 9,696,331
    • Issue date Jul 4, 2017
    • Hitachi High-Technologies Corporation
    • Masaaki Hirano
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Electronic component
    • Patent number 9,659,713
    • Issue date May 23, 2017
    • TDK Corporation
    • Yukihiko Shirakawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Filler pipe mounting structure
    • Patent number 9,630,490
    • Issue date Apr 25, 2017
    • Yachiyo Industry Co., Ltd.
    • Kazuhiro Nakamura
    • B60 - VEHICLES IN GENERAL
  • Information Patent Grant

    Electronic component
    • Patent number 9,263,191
    • Issue date Feb 16, 2016
    • TDK Corporation
    • Yukihiko Shirakawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Television apparatus and electronic device
    • Patent number 9,137,927
    • Issue date Sep 15, 2015
    • Kabushiki Kaisha Toshiba
    • Kazuhiro Nakamura
    • H04 - ELECTRIC COMMUNICATION TECHNIQUE
  • Information Patent Grant

    Electronic component
    • Patent number 9,064,623
    • Issue date Jun 23, 2015
    • TDK Corporation
    • Yukihiko Shirakawa
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,943,909
    • Issue date Feb 3, 2015
    • Hitachi High-Technologies Corporation
    • Satoru Chida
    • G01 - MEASURING TESTING
  • Information Patent Grant

    Automatic analyzer
    • Patent number 8,916,095
    • Issue date Dec 23, 2014
    • Hitachi High-Technologies Corporation
    • Satoshi Shibuya
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    BLOW MOLDING DEVICE AND MANUFACTURING METHOD OF RESIN LINER FOR PRE...
    • Publication number 20220410462
    • Publication date Dec 29, 2022
    • YACHIYO INDUSTRY CO., LTD.
    • Kazuhiro NAKAMURA
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Application

    ELECTRONIC DEVICE
    • Publication number 20220308636
    • Publication date Sep 29, 2022
    • Dynabook Inc.
    • Takehiro Hori
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZING DEVICE
    • Publication number 20180180636
    • Publication date Jun 28, 2018
    • Hitachi High-Technologies Corporation
    • Hiroyuki TAKAYAMA
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE
    • Publication number 20180156702
    • Publication date Jun 7, 2018
    • Hitachi High-Technologies Corporation
    • Naoto SUZUKI
    • Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
  • Information Patent Application

    OXYGEN DETECTING AGENT COMPOSITION, AND MOLDED ARTICLE, SHEET, PACK...
    • Publication number 20180067055
    • Publication date Mar 8, 2018
    • Mitsubishi Gas Chemical Company, Inc.
    • Kazuhiro NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    COMPONENT MOUNTING STRUCTURE FOR FUEL TANK
    • Publication number 20170305265
    • Publication date Oct 26, 2017
    • YACHIYO INDUSTRY CO., LTD.
    • Kazuaki Shoji
    • B60 - VEHICLES IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYZING APPARATUS
    • Publication number 20170219617
    • Publication date Aug 3, 2017
    • Hitachi High-Technologies Corporation
    • Kenichi HIRAMI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZING APPARATUS
    • Publication number 20170176484
    • Publication date Jun 22, 2017
    • Hitachi High-Technologies Corporation
    • Yoshiki MURAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170153261
    • Publication date Jun 1, 2017
    • Hitachi High-Technologies Corporation
    • Satoru CHIDA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PRESSURE VESSEL AND METHOD FOR WINDING FILAMENT
    • Publication number 20170045181
    • Publication date Feb 16, 2017
    • YACHIYO INDUSTRY CO., LTD.
    • Yoshihiro WATANABE
    • B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20170010294
    • Publication date Jan 12, 2017
    • Hitachi High-Technologies Corporation
    • Yoshiki MURAMATSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20160341753
    • Publication date Nov 24, 2016
    • Hitachi High-Technologies Corporation
    • Yoshiaki SAITO
    • G01 - MEASURING TESTING
  • Information Patent Application

    SEAL STRUCTURE FOR FUEL TANK
    • Publication number 20160332512
    • Publication date Nov 17, 2016
    • YACHIYO INDUSTRY CO., LTD.
    • Kazuhiro NAKAMURA
    • B60 - VEHICLES IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20160334432
    • Publication date Nov 17, 2016
    • Hitachi High-Technologies Corporation
    • Masaru MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER DEVICE
    • Publication number 20160327587
    • Publication date Nov 10, 2016
    • Hitachi High-Technologies Corporation
    • Akihiro YASUI
    • G01 - MEASURING TESTING
  • Information Patent Application

    OXYGEN DETECTION AGENT COMPOSITION, OXYGEN DETECTION SHEET, PACKAGI...
    • Publication number 20160153946
    • Publication date Jun 2, 2016
    • MITSUBISHI GAS CHEMICAL COMPANY, INC
    • Kazuhiro NAKAMURA
    • G01 - MEASURING TESTING
  • Information Patent Application

    PRESSURE CONTAINER
    • Publication number 20160123532
    • Publication date May 5, 2016
    • YACHIYO INDUSTRY CO., LTD.
    • Kazuhiro Nakamura
    • F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
  • Information Patent Application

    PRESSURE CONTAINER
    • Publication number 20160123538
    • Publication date May 5, 2016
    • YACHIYO INDUSTRY CO., LTD.
    • Kazuhiro Nakamura
    • F17 - STORING OF DISTRIBUTING GASES OR LIQUIDS
  • Information Patent Application

    ELECTRONIC COMPONENT
    • Publication number 20160118193
    • Publication date Apr 28, 2016
    • TDK Corporation
    • Yukihiko SHIRAKAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    AUTOMATIC ANALYZING DEVICE
    • Publication number 20160061852
    • Publication date Mar 3, 2016
    • Hitachi High-Technologies Corporation
    • Hiroyuki TAKAYAMA
    • B08 - CLEANING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20150346231
    • Publication date Dec 3, 2015
    • Hitachi High-Technologies Corporation
    • Takamichi Mori
    • G01 - MEASURING TESTING
  • Information Patent Application

    COMPUTER APPARATUS AND CONTROL METHOD THEREOF
    • Publication number 20150332658
    • Publication date Nov 19, 2015
    • Kabushiki Kaisha Toshiba
    • Kazuhiro Nakamura
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    ELECTRONIC COMPONENT
    • Publication number 20150255215
    • Publication date Sep 10, 2015
    • TDK Corporation
    • Yukihiko SHIRAKAWA
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    FILLER PIPE MOUNTING STRUCTURE
    • Publication number 20150239339
    • Publication date Aug 27, 2015
    • YACHIYO INDUSTRY CO., LTD.
    • Kazuhiro Nakamura
    • B60 - VEHICLES IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20150192600
    • Publication date Jul 9, 2015
    • Hitachi High-Technologies Corporation
    • Takamichi Mori
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20150010436
    • Publication date Jan 8, 2015
    • Hitachi High-Technologies Corporation
    • Takenori Okusa
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140377132
    • Publication date Dec 25, 2014
    • Hitachi High-Technologies Corporation
    • Akihiro Shimase
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND METHOD FOR WASHING SAMPLE-PIPETTING PROBE
    • Publication number 20140363896
    • Publication date Dec 11, 2014
    • Naoto Suzuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    SWITCHING CIRCUIT, SEMICONDUCTOR DEVICE, AND ELECTRONIC APPARATUS
    • Publication number 20140215118
    • Publication date Jul 31, 2014
    • Kabushiki Kaisha Toshiba
    • Koichi Senuma
    • G06 - COMPUTING CALCULATING COUNTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20140199779
    • Publication date Jul 17, 2014
    • Hitachi High-Technologies Corporation
    • Akihiro Yasui
    • G01 - MEASURING TESTING