Kazuhiro Nakazawa

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Sagamihara, JP

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for testing circuit board
- Patent number 6,366,100
- Issue date Apr 2, 2002
- Fujitsu Limited
- Akio Ito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing circuit board
- Patent number 6,154,038
- Issue date Nov 28, 2000
- Fujitsu Limited
- Akio Ito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing circuit board
- Patent number 5,680,056
- Issue date Oct 21, 1997
- Fujitsu Limited
- Akio Ito
- G01 - MEASURING TESTING