KAZUHIRO NINOMIYA

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KAWASAKI-SHI, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor memory improved for testing
- Patent number 6,721,910
- Issue date Apr 13, 2004
- Fujitsu Limited
- Kazuhiro Ninomiya
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit device incorporating DLL circuit
- Patent number 6,522,182
- Issue date Feb 18, 2003
- Fujitsu Limited
- Hiroyoshi Tomita
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR MEMORY IMPROVED FOR TESTING
- Publication number 20030177424
- Publication date Sep 18, 2003
- KAZUHIRO NINOMIYA
- G11 - INFORMATION STORAGE
Information Patent Application
INTEGRATED CIRCUIT DEVICE INCORPORATING DLL CIRCUIT
- Publication number 20010043100
- Publication date Nov 22, 2001
- HIROYOSHI TOMITA
- G11 - INFORMATION STORAGE