Kazuhiro Nishimura

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device
- Patent number 11,333,123
- Issue date May 17, 2022
- Mitsubishi Electric Corporation
- Makoto Ueno
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Semiconductor-product testing device, method for testing semiconduc...
- Patent number 10,886,001
- Issue date Jan 5, 2021
- Renesas Electronics Corporation
- Naoki Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor product quality management server, semiconductor devi...
- Patent number 10,845,414
- Issue date Nov 24, 2020
- Renesas Electronics Corporation
- Kazuhiro Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Detector apparatus and detector system
- Patent number 10,809,097
- Issue date Oct 20, 2020
- Asahi Kasei Microdevices Corporation
- Masao Matsubara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus, ignition device for internal combustion en...
- Patent number 10,651,113
- Issue date May 12, 2020
- Mitsubishi Electric Corporation
- Kazuhiro Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor device, manufacturing method therefor and semiconduct...
- Patent number 10,438,947
- Issue date Oct 8, 2019
- Mitsubishi Electric Corporation
- Kazuhiro Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Power semiconductor device for igniter
- Patent number 8,861,175
- Issue date Oct 14, 2014
- Mitsubishi Electric Corporation
- Shinsuke Godo
- F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
Information Patent Grant
Semiconductor apparatus using back-side high-withstand-voltage inte...
- Patent number 7,787,225
- Issue date Aug 31, 2010
- Mitsubishi Electric Corporation
- Kazuhiro Nishimura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image forming apparatus with movable recording detecting device
- Patent number 7,630,680
- Issue date Dec 8, 2009
- Canon Kabushiki Kaisha
- Shuji Nishitani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Tester, a test system, and a testing method for a semiconductor int...
- Patent number 6,480,016
- Issue date Nov 12, 2002
- Mitsubishi Denki Kabushiki Kaisha
- Shinji Motoi
- G01 - MEASURING TESTING
Information Patent Grant
IC measuring method
- Patent number 5,386,189
- Issue date Jan 31, 1995
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor integrated circuit device and test method therefor
- Patent number 5,367,263
- Issue date Nov 22, 1994
- Mitsubishi Denki Kabushiki Kaisha
- Kiyotoshi Ueda
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
- Publication number 20230420445
- Publication date Dec 28, 2023
- Mitsubishi Electric Corporation
- Makoto UENO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230012134
- Publication date Jan 12, 2023
- Mitsubishi Electric Corporation
- Shintaro ARAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MODULE
- Publication number 20220139794
- Publication date May 5, 2022
- Mitsubishi Electric Corporation
- Kazuhiro NISHIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200240385
- Publication date Jul 30, 2020
- Mitsubishi Electric Corporation
- Makoto UENO
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Application
SEMICONDUCTOR PRODUCT QUALITY MANAGEMENT SERVER, SEMICONDUCTOR DEVI...
- Publication number 20200003832
- Publication date Jan 2, 2020
- RENESAS ELECTRONICS CORPORATION
- Kazuhiro NISHIMURA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR-PRODUCT TESTING DEVICE, METHOD FOR TESTING SEMICONDUC...
- Publication number 20190311776
- Publication date Oct 10, 2019
- RENESAS ELECTRONICS CORPORATION
- Naoki YAMADA
- G11 - INFORMATION STORAGE
Information Patent Application
DETECTOR APPARATUS AND DETECTOR SYSTEM
- Publication number 20190101414
- Publication date Apr 4, 2019
- ASAHI KASEI MICRODEVICES CORPORATION
- Masao MATSUBARA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR APPARATUS, IGNITION DEVICE FOR INTERNAL COMBUSTION EN...
- Publication number 20190080986
- Publication date Mar 14, 2019
- Mitsubishi Electric Corporation
- Kazuhiro NISHIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREFOR AND SEMICONDUCT...
- Publication number 20170345817
- Publication date Nov 30, 2017
- Mitsubishi Electric Corporation
- Kazuhiro NISHIMURA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
POWER SEMICONDUCTOR DEVICE FOR IGNITER
- Publication number 20110141651
- Publication date Jun 16, 2011
- MITSUBISHI ELECTRIC CORPORATION
- Shinsuke GODO
- F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
Information Patent Application
SEMICONDUCTOR APPARATUS USING BACK-SIDE HIGH-WITHSTAND-VOLTAGE INTE...
- Publication number 20080099838
- Publication date May 1, 2008
- MITSUBISHI ELECTRIC CORPORATION
- Kazuhiro Nishimura
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Application
IMAGE FORMING APPARATUS
- Publication number 20070127963
- Publication date Jun 7, 2007
- Canon Kabushiki Kaisha
- Shuji Nishitani
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Test device of A/D converter
- Publication number 20040113605
- Publication date Jun 17, 2004
- RENESAS TECHNOLOGY CORP.
- Kazuhiro Nishimura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method for testing an AD-converter
- Publication number 20030220758
- Publication date Nov 27, 2003
- Mitsubishi Denki Kabushiki Kaisha
- Kazuhiro Nishimura
- H03 - BASIC ELECTRONIC CIRCUITRY

Kazuhiro Nishimura

Person

Patents Grantslast 30 patents

Semiconductor device

Semiconductor-product testing device, method for testing semiconduc...

Semiconductor product quality management server, semiconductor devi...

Detector apparatus and detector system

Semiconductor apparatus, ignition device for internal combustion en...

Semiconductor device, manufacturing method therefor and semiconduct...

Power semiconductor device for igniter

Semiconductor apparatus using back-side high-withstand-voltage inte...

Image forming apparatus with movable recording detecting device

Tester, a test system, and a testing method for a semiconductor int...

IC measuring method

Semiconductor integrated circuit device and test method therefor

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR DEVICE AND SEMICONDUCTOR MODULE

SEMICONDUCTOR DEVICE

SEMICONDUCTOR PRODUCT QUALITY MANAGEMENT SERVER, SEMICONDUCTOR DEVI...

SEMICONDUCTOR-PRODUCT TESTING DEVICE, METHOD FOR TESTING SEMICONDUC...

DETECTOR APPARATUS AND DETECTOR SYSTEM

SEMICONDUCTOR APPARATUS, IGNITION DEVICE FOR INTERNAL COMBUSTION EN...

SEMICONDUCTOR DEVICE, MANUFACTURING METHOD THEREFOR AND SEMICONDUCT...

POWER SEMICONDUCTOR DEVICE FOR IGNITER

SEMICONDUCTOR APPARATUS USING BACK-SIDE HIGH-WITHSTAND-VOLTAGE INTE...

IMAGE FORMING APPARATUS

Test device of A/D converter

Method for testing an AD-converter