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Kazuhiro Noda

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  • Tokyo, JP
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    CONTAINER DISPOSAL UNIT, AUTOMATIC ANALYZER HAVING CONTAINER DISPOS...
    • Publication number 20240264188
    • Publication date Aug 8, 2024
    • HITACHI HIGH-TECH CORPORATION
    • Yohei SHIOTA
    • G01 - MEASURING TESTING
  • Information Patent Application

    ULTRASOUND IMAGE APPARATUS AND LIQUID INFILTRATION PREVENTION METHO...
    • Publication number 20230375507
    • Publication date Nov 23, 2023
    • Hitachi Power Solutions Co., Ltd.
    • Shigeru OHNO
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20230366902
    • Publication date Nov 16, 2023
    • Hitachi High-Tech Corporation
    • Shun KURIKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER AND ANALYSIS METHOD
    • Publication number 20230341431
    • Publication date Oct 26, 2023
    • Hitachi High-Tech Corporation
    • Masayuki KUWABARA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20230333133
    • Publication date Oct 19, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER, DISPENSING DEVICE, AND DISPENSING CONTROL METHOD
    • Publication number 20230184801
    • Publication date Jun 15, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Ruochi HSU
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20230061292
    • Publication date Mar 2, 2023
    • HITACHI HIGH-TECH CORPORATION
    • Shun KURIKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220397582
    • Publication date Dec 15, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Mariko MIYAZAKI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE AND DISPENSING METHOD
    • Publication number 20220381799
    • Publication date Dec 1, 2022
    • Hitachi High-Tech Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analyzer
    • Publication number 20220317140
    • Publication date Oct 6, 2022
    • Hitachi High-Tech Corporation
    • Nobuya FUKUDA
    • B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
  • Information Patent Application

    AUTOMATIC ANALYSIS DEVICE
    • Publication number 20220146540
    • Publication date May 12, 2022
    • Hitachi High-Tech Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20220146543
    • Publication date May 12, 2022
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro KUMAGAI
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYZER
    • Publication number 20210318350
    • Publication date Oct 14, 2021
    • HITACHI HIGH-TECH CORPORATION
    • Takahiro Kumagai
    • G01 - MEASURING TESTING
  • Information Patent Application

    Automatic Analysis Device
    • Publication number 20190094250
    • Publication date Mar 28, 2019
    • Hitachi High-Technologies Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYZER
    • Publication number 20180188275
    • Publication date Jul 5, 2018
    • Hitachi High-Technologies Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATED ANALYSIS DEVICE, AND LID OPENING/CLOSING MECHANISM
    • Publication number 20180024154
    • Publication date Jan 25, 2018
    • Hitachi High-Technologies Corporation
    • Takushi MIYAKAWA
    • G01 - MEASURING TESTING
  • Information Patent Application

    AUTOMATIC ANALYTICAL APPARATUS
    • Publication number 20160334431
    • Publication date Nov 17, 2016
    • Hitachi High-Technologies Corporation
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    GEL ELECTRODE SECONDARY CELL
    • Publication number 20140162134
    • Publication date Jun 12, 2014
    • SONY CORPORATION
    • Tadashi Senoo
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    GEL ELECTRODE SECONDARY CELL
    • Publication number 20130280617
    • Publication date Oct 24, 2013
    • TADASHI SENOO
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Application

    RADIOLOGICAL IMAGE DETECTION APPARATUS AND METHOD OF MANUFACTURING...
    • Publication number 20120241627
    • Publication date Sep 27, 2012
    • FUJIFILM CORPORATION
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    RADIOGRAPHIC IMAGE CAPTURING APPARATUS
    • Publication number 20120126129
    • Publication date May 24, 2012
    • FUJIFILM CORPORATION
    • Haruyasu NAKATSUGAWA
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Application

    RADIOGRAPHIC IMAGE CAPTURING APPARATUS
    • Publication number 20120126124
    • Publication date May 24, 2012
    • FUJIFILM CORPORATION
    • Haruyasu NAKATSUGAWA
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Application

    RADIOGRAPHIC IMAGING DEVICE AND RADIOGRAPHIC IMAGING SYSTEM
    • Publication number 20120119097
    • Publication date May 17, 2012
    • FUJIFILM CORPORATION
    • Naoyuki NISHINO
    • A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
  • Information Patent Application

    RADIATION DETECTOR
    • Publication number 20120112075
    • Publication date May 10, 2012
    • FUJIFILM CORPORATION
    • Kazuhiro NODA
    • G01 - MEASURING TESTING
  • Information Patent Application

    DISPLAY APPARATUS AND DRIVING METHOD THEREFOR
    • Publication number 20120050243
    • Publication date Mar 1, 2012
    • SONY CORPORATION
    • KAZUHIRO NODA
    • G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
  • Information Patent Application

    Electrochemical Device
    • Publication number 20110171536
    • Publication date Jul 14, 2011
    • SONY CORPORATION
    • Hideki Oki
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
  • Information Patent Application

    DYE-SENSITIZED SOLAR CELL AND A METHOD OF MANUFACTURING THE SAME
    • Publication number 20110155223
    • Publication date Jun 30, 2011
    • SONY CORPORATION
    • Masahiro Morooka
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
  • Information Patent Application

    SYSTEM FOR PRETREATING SAMPLE
    • Publication number 20110088517
    • Publication date Apr 21, 2011
    • Hitachi High-Technologies Corporation
    • Naoto Tsujimura
    • G01 - MEASURING TESTING
  • Information Patent Application

    ELECTRONIC DEVICE
    • Publication number 20110083719
    • Publication date Apr 14, 2011
    • Sony Corporation
    • Harumi Takada
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
  • Information Patent Application

    PHOTOELECTRIC CONVERSION DEVICE, ITS MANUFACTURING METHOD, ELECTRON...
    • Publication number 20100255632
    • Publication date Oct 7, 2010
    • SONY CORPORATION
    • Kenichi Ishibashi
    • Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...