Kazuhiro Shimoda

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Liquid crystalline composition, optically anisotropic film, optical...
- Patent number 7,799,242
- Issue date Sep 21, 2010
- Fujifilm Corporation
- Kazuhiro Shimoda
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Anti-reflection film producing method and apparatus
- Patent number 7,722,921
- Issue date May 25, 2010
- FUJIFILM Corporation
- Kazuhiro Shimoda
- G02 - OPTICS
Information Patent Grant
Apparatus and method for inspecting film defect
- Patent number 7,428,049
- Issue date Sep 23, 2008
- FUJIFILM Corporation
- Kazuhiro Shimoda
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, system and method for checking film for defects
- Patent number 6,650,410
- Issue date Nov 18, 2003
- Fuji Photo Film Co., Ltd.
- Kazuhiro Shimoda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Optical Compensation Film, Polarizing Plate, and Liquid Crystal Dis...
- Publication number 20080225210
- Publication date Sep 18, 2008
- FUJIFILM Corporation
- Kazuhiro Shimoda
- G02 - OPTICS
Information Patent Application
METHOD FOR PRODUCING OPTICAL FILM AND OPTICAL FILM
- Publication number 20080206493
- Publication date Aug 28, 2008
- FUJIFILM CORPORATION
- Kazuhiro SHIMODA
- G02 - OPTICS
Information Patent Application
Liquid Crystalline Composition, Optically Anisotropic Film, Optical...
- Publication number 20080203357
- Publication date Aug 28, 2008
- FUJIFILM Corporation
- Kazuhiro Shimoda
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING FILM DEFECT
- Publication number 20070285665
- Publication date Dec 13, 2007
- FUJIFILM CORPORATION
- Kazuhiro SHIMODA
- G01 - MEASURING TESTING
Information Patent Application
Anti-reflection film producing method and apparatus
- Publication number 20070253062
- Publication date Nov 1, 2007
- FUJIFILM Corporation
- Kazuhiro Shimoda
- G02 - OPTICS
Information Patent Application
Apparatus, system and method for checking film for defect
- Publication number 20010021016
- Publication date Sep 13, 2001
- Kazuhiro Shimoda
- G01 - MEASURING TESTING