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Kazuhiro Taguchi
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Yokohama Kanagawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Current detection circuit, current detection system, and method of...
Patent number
11,448,668
Issue date
Sep 20, 2022
Kabushiki Kaisha Toshiba
Kazuhiro Taguchi
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor integrated circuit device and current detection circuit
Patent number
11,378,598
Issue date
Jul 5, 2022
Kabushiki Kaisha Toshiba
Tomohiro Ando
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
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Patent Application
CURRENT DETECTION CIRCUIT, CURRENT DETECTION SYSTEM, AND METHOD OF...
Publication number
20210278444
Publication date
Sep 9, 2021
KABUSHIKI KAISHA TOSHIBA
Kazuhiro Taguchi
G01 - MEASURING TESTING
Information
Patent Application
SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE AND CURRENT DETECTION CIRCUIT
Publication number
20210278445
Publication date
Sep 9, 2021
Kabushiki Kaisha Toshiba
Tomohiro ANDO
H03 - BASIC ELECTRONIC CIRCUITRY