Kazuhiro TAKABE

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Patents Grantslast 30 patents

Information Patent Grant
Probe apparatus and method for measuring electrical characteristics...
- Patent number 7,719,297
- Issue date May 18, 2010
- Tokyo Electron Limited
- Kazuhiro Takabe
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE APPARATUS, PROBING METHOD AND STORAGE MEDIUM
- Publication number 20080238463
- Publication date Oct 2, 2008
- TOKYO ELECTRON LIMITED
- Kazuhiro TAKABE
- G01 - MEASURING TESTING