Kazuhiro Takigawa

Person

Nagaokakyo-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Void-arranged structure and measurement method using the same
- Patent number 10,408,750
- Issue date Sep 10, 2019
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring characteristics of object
- Patent number 9,063,078
- Issue date Jun 23, 2015
- MURATA MANUFACTURING CO., LTD.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Grant
Method for measurement of properties of analyte
- Patent number 9,007,578
- Issue date Apr 14, 2015
- MURATA MANUFACTURING CO., LTD.
- Kazuhiro Takigawa
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring characteristics of specimen, and flat-plate per...
- Patent number 8,610,071
- Issue date Dec 17, 2013
- MURATA MANUFACTURING CO., LTD.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring characteristics of specimen and flat-plate peri...
- Patent number 8,304,732
- Issue date Nov 6, 2012
- MURATA MANUFACTURING CO., LTD.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring characteristic of object to be measured, struc...
- Patent number 8,269,967
- Issue date Sep 18, 2012
- MURATA MANUFACTURING CO., LTD.
- Seiji Kamba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VOID-ARRANGED STRUCTURE AND MEASUREMENT METHOD USING THE SAME
- Publication number 20160011104
- Publication date Jan 14, 2016
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
PERIODIC STRUCTURE AND MEASUREMENT METHOD USING THE SAME
- Publication number 20140247452
- Publication date Sep 4, 2014
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND FLAT-PLATE PER...
- Publication number 20130221209
- Publication date Aug 29, 2013
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND APERTURE ARRAY...
- Publication number 20130062524
- Publication date Mar 14, 2013
- Kazuhiro Takigawa
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN AND SENSING DEVICE...
- Publication number 20130011935
- Publication date Jan 10, 2013
- Murata Manufacturing Co., Ltd.
- Koji Tanaka
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Measuring Characteristics of Object
- Publication number 20120262190
- Publication date Oct 18, 2012
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring Characteristics of Specimen and Flat-Plate Peri...
- Publication number 20120153159
- Publication date Jun 21, 2012
- Murata Manufacturing Co., Ltd.
- Seiji Kamba
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASUREMENT OF PROPERTIES OF ANALYTE
- Publication number 20120137755
- Publication date Jun 7, 2012
- National University Corporation, Tohoku University
- Kazuhiro Takigawa
- G01 - MEASURING TESTING
Information Patent Application
Method of Measuring Characteristics of Specimen, Measuring Device,...
- Publication number 20120126123
- Publication date May 24, 2012
- Murata Manufacturing Co., Ltd.
- Takashi Kondo
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING CHARACTERISTIC OF OBJECT TO BE MEASURED, STRUC...
- Publication number 20120008142
- Publication date Jan 12, 2012
- NATIONAL UNIVERSITY CORPORATION TOHOKU UNIVERSITY
- Seiji Kamba
- G01 - MEASURING TESTING

Kazuhiro Takigawa

Person

Patents Grantslast 30 patents

Void-arranged structure and measurement method using the same

Method and apparatus for measuring characteristics of object

Method for measurement of properties of analyte

Method of measuring characteristics of specimen, and flat-plate per...

Method of measuring characteristics of specimen and flat-plate peri...

Method for measuring characteristic of object to be measured, struc...

Patents Applicationslast 30 patents

VOID-ARRANGED STRUCTURE AND MEASUREMENT METHOD USING THE SAME

PERIODIC STRUCTURE AND MEASUREMENT METHOD USING THE SAME

METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND FLAT-PLATE PER...

METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN, AND APERTURE ARRAY...

METHOD OF MEASURING CHARACTERISTICS OF SPECIMEN AND SENSING DEVICE...

Method and Apparatus for Measuring Characteristics of Object

Method of Measuring Characteristics of Specimen and Flat-Plate Peri...

METHOD FOR MEASUREMENT OF PROPERTIES OF ANALYTE

Method of Measuring Characteristics of Specimen, Measuring Device,...

METHOD FOR MEASURING CHARACTERISTIC OF OBJECT TO BE MEASURED, STRUC...