Kazuhiro Tashiro

Person

Shinjuku, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Prober and method of inspecting semiconductor chip
- Patent number 8,797,055
- Issue date Aug 5, 2014
- Fujitsu Semiconductor Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
- Patent number 8,759,119
- Issue date Jun 24, 2014
- Fujitsu Semiconductor Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Tray in combination with electronic component attaching tool attach...
- Patent number 8,671,557
- Issue date Mar 18, 2014
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method of testing a semiconductor device and suctioning a semicondu...
- Patent number 8,404,496
- Issue date Mar 26, 2013
- Fujitsu Semiconductor Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Method of semiconductor device protection
- Patent number 8,268,670
- Issue date Sep 18, 2012
- Fujitsu Semiconductor Limited
- Kazuhiro Tashiro
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Semiconductor device packaging structure
- Patent number 8,164,181
- Issue date Apr 24, 2012
- Fujitsu Semiconductor Limited
- Kazuhiro Tashiro
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Testing device for testing a semiconductor device
- Patent number 8,159,250
- Issue date Apr 17, 2012
- Fujitsu Semiconductor Limited
- Yuji Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
IC socket with attached electronic component
- Patent number 8,051,554
- Issue date Nov 8, 2011
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Semiconductor integrated circuit device and test method thereof
- Patent number 7,915,720
- Issue date Mar 29, 2011
- Fujitsu Semiconductor Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Contactor and test method using contactor
- Patent number 7,825,676
- Issue date Nov 2, 2010
- Fujitsu Semiconductor Limited
- Daisuke Koizumi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method of semiconductor device protection, package of semiconductor...
- Patent number 7,807,481
- Issue date Oct 5, 2010
- Fujitsu Semiconductor Limited
- Kazuhiro Tashiro
- Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
Information Patent Grant
Contactor for electronic components and test method using the same
- Patent number 7,518,388
- Issue date Apr 14, 2009
- Fujitsu Microelectronics Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Electronic component attaching tool
- Patent number 7,430,798
- Issue date Oct 7, 2008
- Fujitsu Limited
- Daisuke Koizumi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Contactor having contact electrodes of metal springs embedded in a...
- Patent number 7,403,024
- Issue date Jul 22, 2008
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device protection cover, and semiconductor device uni...
- Patent number 7,382,046
- Issue date Jun 3, 2008
- Fujitsu Limited
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor apparatus testing arrangement and semiconductor appar...
- Patent number 7,355,421
- Issue date Apr 8, 2008
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Contactor for electronic components and test method using the same
- Patent number 7,309,996
- Issue date Dec 18, 2007
- Fujitsu Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device testing method and testing equipment
- Patent number 7,199,600
- Issue date Apr 3, 2007
- Fujitsu Limited
- Hitoshi Izuru
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing device
- Patent number 7,161,370
- Issue date Jan 9, 2007
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
LSI package, LSI element testing method, and semiconductor device m...
- Patent number 7,145,250
- Issue date Dec 5, 2006
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Testing device and testing method of a semiconductor device
- Patent number 7,129,726
- Issue date Oct 31, 2006
- Fujitsu Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device having an alignment mark formed by the same ma...
- Patent number 7,112,889
- Issue date Sep 26, 2006
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Contactor for testing miniaturized devices and components
- Patent number 6,927,343
- Issue date Aug 9, 2005
- Fujitsu Limited
- Naoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Method of attaching electronic component and electronic component a...
- Patent number 6,924,174
- Issue date Aug 2, 2005
- Fujitsu Limited
- Daisuke Koizumi
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Semiconductor testing device
- Patent number 6,882,169
- Issue date Apr 19, 2005
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Contactor for testing semiconductor device and manufacturing method...
- Patent number 6,791,345
- Issue date Sep 14, 2004
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Contactor, method for manufacturing such contactor, and testing met...
- Patent number 6,767,219
- Issue date Jul 27, 2004
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor testing device
- Patent number 6,661,247
- Issue date Dec 9, 2003
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for passive optical characterization of semico...
- Patent number 6,249,135
- Issue date Jun 19, 2001
- Fujitsu Limited
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Grant
Attachment structure of semiconductor device socket
- Patent number 6,203,332
- Issue date Mar 20, 2001
- Fujitsu Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF TESTING A SEMICONDUCTOR DEVICE AND SUCTIONING A SEMICONDU...
- Publication number 20130171748
- Publication date Jul 4, 2013
- FUJITSU SEMICONDUCTOR LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ATTACHING ELECTRONIC COMPONENT AND ELECTRONIC COMPONENT A...
- Publication number 20120005883
- Publication date Jan 12, 2012
- FUJITSU SEMICONDUCTOR LIMITED
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
METHOD OF SEMICONDUCTOR DEVICE PROTECTION
- Publication number 20120005875
- Publication date Jan 12, 2012
- FUJITSU SEMICONDUCTOR LIMITED
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBER, TESTING APPARATUS, AND METHOD OF INSPECTING SEMICONDUCTOR CHIP
- Publication number 20110254574
- Publication date Oct 20, 2011
- FUJITSU SEMICONDUCTOR LIMITED
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF SEMICONDUCTOR DEVICE PROTECTION, PACKAGE OF SEMICONDUCTOR...
- Publication number 20110049699
- Publication date Mar 3, 2011
- FUJITSU SEMICONDUCTOR LIMITED
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING DEVICE OF SEMICONDUCTOR DEVICE
- Publication number 20090267630
- Publication date Oct 29, 2009
- Fujitsu Microelectronics Limited
- Yuji Maruyama
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF ATTACHING ELECTRONIC COMPONENT AND ELECTRONIC COMPONENT A...
- Publication number 20080299790
- Publication date Dec 4, 2008
- FUJITSU LIMITED
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Semiconductor substrate, manufacturing method of a semiconductor de...
- Publication number 20080227226
- Publication date Sep 18, 2008
- Fujitsu Limited
- Shigeru Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of semiconductor device protection, package of semiconductor...
- Publication number 20080203558
- Publication date Aug 28, 2008
- FUJITSU LIMITED
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contactor for electronic components and test method using the same
- Publication number 20080136433
- Publication date Jun 12, 2008
- Fujitsu Limited
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Application
Contactor and test method using contactor
- Publication number 20070252608
- Publication date Nov 1, 2007
- FUJITSU LIMITED
- Daisuke Koizumi
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit device and test method thereof
- Publication number 20070170425
- Publication date Jul 26, 2007
- FUJITSU LIMITED
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor apparatus testing arrangement and semiconductor appar...
- Publication number 20070096761
- Publication date May 3, 2007
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having an alignment mark formed by the same ma...
- Publication number 20060279003
- Publication date Dec 14, 2006
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Testing device and testing method of a semiconductor device
- Publication number 20060220667
- Publication date Oct 5, 2006
- FUJITSU LIMITED
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor substrate, manufacturing method of a semiconductor de...
- Publication number 20060097356
- Publication date May 11, 2006
- FUJITSU LIMITED
- Shigeru Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Semiconductor device testing method and testing equipment
- Publication number 20060061379
- Publication date Mar 23, 2006
- FUJITSU LIMITED
- Hitoshi Izuru
- G01 - MEASURING TESTING
Information Patent Application
Method of attaching electronic component and electronic component a...
- Publication number 20050204551
- Publication date Sep 22, 2005
- FUJITSU LIMITED
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
LSI package, LSI element testing method, and semiconductor device m...
- Publication number 20050189649
- Publication date Sep 1, 2005
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor testing device
- Publication number 20050162180
- Publication date Jul 28, 2005
- FIJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Method of semiconductor device protection, package of semiconductor...
- Publication number 20050072972
- Publication date Apr 7, 2005
- FUJITSU LIMITED
- Kazuhiro Tashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Contactor for testing semiconductor device and manufacturing method...
- Publication number 20040266272
- Publication date Dec 30, 2004
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Contactor for electronic components and test method using the same
- Publication number 20040239357
- Publication date Dec 2, 2004
- FUJITSU LIMITED
- Kazuhiro Tashiro
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor testing device
- Publication number 20040124866
- Publication date Jul 1, 2004
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Method of attaching electronic component and electronic component a...
- Publication number 20040055150
- Publication date Mar 25, 2004
- FUJITSU LIMITED
- Daisuke Koizumi
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
Contactor, method for manufacturing such contactor, and testing met...
- Publication number 20030186566
- Publication date Oct 2, 2003
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Contactor for testing miniaturized devices and components
- Publication number 20030127246
- Publication date Jul 10, 2003
- FUJITSU LIMITED
- Naoyuki Watanabe
- G01 - MEASURING TESTING
Information Patent Application
Contactor for testing semiconductor device and manufacturing method...
- Publication number 20020105347
- Publication date Aug 8, 2002
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor testing device
- Publication number 20010011724
- Publication date Aug 9, 2001
- FUJITSU LIMITED
- Shigeyuki Maruyama
- G01 - MEASURING TESTING

Kazuhiro Tashiro

Person

Patents Grantslast 30 patents

Prober and method of inspecting semiconductor chip

Method of testing a semiconductor device and suctioning a semicondu...

Tray in combination with electronic component attaching tool attach...

Method of testing a semiconductor device and suctioning a semicondu...

Method of semiconductor device protection

Semiconductor device packaging structure

Testing device for testing a semiconductor device

IC socket with attached electronic component

Semiconductor integrated circuit device and test method thereof

Contactor and test method using contactor

Method of semiconductor device protection, package of semiconductor...

Contactor for electronic components and test method using the same

Electronic component attaching tool

Contactor having contact electrodes of metal springs embedded in a...

Semiconductor device protection cover, and semiconductor device uni...

Semiconductor apparatus testing arrangement and semiconductor appar...

Contactor for electronic components and test method using the same

Semiconductor device testing method and testing equipment

Semiconductor testing device

LSI package, LSI element testing method, and semiconductor device m...

Testing device and testing method of a semiconductor device

Semiconductor device having an alignment mark formed by the same ma...

Contactor for testing miniaturized devices and components

Method of attaching electronic component and electronic component a...

Semiconductor testing device

Contactor for testing semiconductor device and manufacturing method...

Contactor, method for manufacturing such contactor, and testing met...

Semiconductor testing device

Method and apparatus for passive optical characterization of semico...

Attachment structure of semiconductor device socket

Patents Applicationslast 30 patents

METHOD OF TESTING A SEMICONDUCTOR DEVICE AND SUCTIONING A SEMICONDU...

METHOD OF ATTACHING ELECTRONIC COMPONENT AND ELECTRONIC COMPONENT A...

METHOD OF SEMICONDUCTOR DEVICE PROTECTION

PROBER, TESTING APPARATUS, AND METHOD OF INSPECTING SEMICONDUCTOR CHIP

METHOD OF SEMICONDUCTOR DEVICE PROTECTION, PACKAGE OF SEMICONDUCTOR...

TESTING DEVICE OF SEMICONDUCTOR DEVICE

METHOD OF ATTACHING ELECTRONIC COMPONENT AND ELECTRONIC COMPONENT A...

Semiconductor substrate, manufacturing method of a semiconductor de...

Method of semiconductor device protection, package of semiconductor...

Contactor for electronic components and test method using the same

Contactor and test method using contactor

Semiconductor integrated circuit device and test method thereof

Semiconductor apparatus testing arrangement and semiconductor appar...

Semiconductor device having an alignment mark formed by the same ma...

Testing device and testing method of a semiconductor device

Semiconductor substrate, manufacturing method of a semiconductor de...

Semiconductor device testing method and testing equipment

Method of attaching electronic component and electronic component a...

LSI package, LSI element testing method, and semiconductor device m...

Semiconductor testing device

Method of semiconductor device protection, package of semiconductor...

Contactor for testing semiconductor device and manufacturing method...

Contactor for electronic components and test method using the same

Semiconductor testing device

Method of attaching electronic component and electronic component a...

Contactor, method for manufacturing such contactor, and testing met...

Contactor for testing miniaturized devices and components

Contactor for testing semiconductor device and manufacturing method...

Semiconductor testing device