Kazuhiro Ueda

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for setting sample observation condition, and...
- Patent number 8,384,030
- Issue date Feb 26, 2013
- Hitachi High-Technologies Corporation
- Kazuhiro Ueda
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope alignment method and scanning electron...
- Patent number 8,188,427
- Issue date May 29, 2012
- Hitachi High-Technologies Corporation
- Junichi Kakuta
- G01 - MEASURING TESTING
Information Patent Grant
Scanning electron microscope with measurement function
- Patent number 7,053,371
- Issue date May 30, 2006
- Hitachi High-Technologies Corporation
- Yuuki Ojima
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Charged-Particle-Beam Device
- Publication number 20120126119
- Publication date May 24, 2012
- Hitachi High-Technologies Corporation
- Ritsuo Fukaya
- G01 - MEASURING TESTING
Information Patent Application
Scanning Electron Microscope Alignment Method and Scanning Electron...
- Publication number 20090032693
- Publication date Feb 5, 2009
- Hitachi High-Technologies Corporation
- Junichi Kakuta
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SETTING SAMPLE OBSERVATION CONDITION, AND...
- Publication number 20080217532
- Publication date Sep 11, 2008
- Hitachi High-Technologies Corporation
- Kazuhiro Ueda
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope with measurement function
- Publication number 20080109755
- Publication date May 8, 2008
- Yuuki Ojima
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope with measurement function
- Publication number 20060219917
- Publication date Oct 5, 2006
- Yuuki Ojima
- G01 - MEASURING TESTING
Information Patent Application
Scanning electron microscope with measurement function
- Publication number 20040164245
- Publication date Aug 26, 2004
- Yuuki Ojima
- G01 - MEASURING TESTING