Kazuhiro Yamamoto

Person

Asaka, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Method for manufacturing semiconductor device, heat-curable resin c...
- Patent number 11,634,614
- Issue date Apr 25, 2023
- Kazuhiro Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Display element
- Patent number 11,215,813
- Issue date Jan 4, 2022
- Kazuhiro Yamamoto
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Permeability evaluation method
- Patent number 10,598,622
- Issue date Mar 24, 2020
- Hitachi Chemical Company, Ltd.
- Koji Suzumura
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Process for manufacturing graphite powder for lithium secondary bat...
- Patent number 10,308,511
- Issue date Jun 4, 2019
- Tokai Carbon Co., Ltd.
- Kazuhiro Yamamoto
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Communication device
- Patent number 9,198,127
- Issue date Nov 24, 2015
- Yamamoto Kazuhiro
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus and testing method
- Patent number 8,933,716
- Issue date Jan 13, 2015
- Advantest Corporation
- Masahiro Ishida
- G11 - INFORMATION STORAGE
Information Patent Grant
Test apparatus and test method
- Patent number 8,554,514
- Issue date Oct 8, 2013
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Method for producing a fuel cell separator
- Patent number 8,524,129
- Issue date Sep 3, 2013
- Tokai Carbon Co., Ltd.
- Kazuhiro Yamamoto
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Time measurement circuit
- Patent number 8,471,754
- Issue date Jun 25, 2013
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus and test method
- Patent number 8,473,248
- Issue date Jun 25, 2013
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, parallel measuring apparatus, testing apparatu...
- Patent number 8,436,604
- Issue date May 7, 2013
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Ring oscillator
- Patent number 8,378,754
- Issue date Feb 19, 2013
- Advantest Corporation
- Kazuhiro Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
System and method of two-stepped laser scattering defect inspection
- Patent number 8,339,593
- Issue date Dec 25, 2012
- Sumco Corporation
- Eiji Kamiyama
- G01 - MEASURING TESTING
Information Patent Grant
Delay circuit
- Patent number 8,269,553
- Issue date Sep 18, 2012
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Loop type clock adjustment circuit and test device
- Patent number 8,198,926
- Issue date Jun 12, 2012
- Advantest Corporation
- Kazuhiro Fujita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test apparatus, demodulation apparatus, test method, demodulation m...
- Patent number 8,159,290
- Issue date Apr 17, 2012
- Advantest Corporation
- Kazuhiro Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
A-D converter
- Patent number 8,031,102
- Issue date Oct 4, 2011
- Advantest Corporation
- Kazuhiro Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Demodulation apparatus, test apparatus and electronic device
- Patent number 7,902,918
- Issue date Mar 8, 2011
- Advantest Corporation
- Kazuhiro Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
D-A converter and D-A converting method
- Patent number 7,859,444
- Issue date Dec 28, 2010
- Advantest Corporation
- Kazuhiro Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Transmission circuit for transmitting a differential signal having...
- Patent number 7,852,122
- Issue date Dec 14, 2010
- Advantest Corporation
- Kazuhiro Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test apparatus
- Patent number 7,756,654
- Issue date Jul 13, 2010
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Electric drill
- Patent number 7,752,763
- Issue date Jul 13, 2010
- Kazuhiro Yamamoto
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Variable delay circuit, recording medium, logic verification method...
- Patent number 7,694,255
- Issue date Apr 6, 2010
- Advantest Corporation
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Electric drill
- Patent number 7,650,699
- Issue date Jan 26, 2010
- Kazuhiro Yamamoto
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Transmission circuit, CMOS semiconductor device, and design method...
- Patent number 7,453,289
- Issue date Nov 18, 2008
- Advantest Corporation
- Kazuhiro Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Semiconductor test apparatus
- Patent number 7,388,393
- Issue date Jun 17, 2008
- Advantest Corporation
- Kazuhiro Yamamoto
- G11 - INFORMATION STORAGE
Information Patent Grant
Timing generator and semiconductor test apparatus
- Patent number 7,034,518
- Issue date Apr 25, 2006
- Advantest Corp.
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Grant
Shock absorbing construction for motorcycles
- Patent number 6,547,294
- Issue date Apr 15, 2003
- Honda Giken Kogyo Kabushiki Kaisha
- Kazuhiro Yamamoto
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Portable telephone system
- Patent number 6,301,472
- Issue date Oct 9, 2001
- Mitsubishi Denki Kabushiki Kaisha
- Jiro Nakasu
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Compositions containing novel protein complexes
- Patent number 6,066,352
- Issue date May 23, 2000
- Kyowa Hakko Kogyo Co., Ltd.
- Masashi Ogasawara
- A21 - BAKING EDIBLE DOUGHS

Patents Applicationslast 30 patents

Information Patent Application
FILM-LIKE ADHESIVE AND METHOD FOR PRODUCING SAME, INTEGRATED DICING...
- Publication number 20250157976
- Publication date May 15, 2025
- Resonac Corporation
- Tomoyo KANEKO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HOLDING DEVICE
- Publication number 20230378783
- Publication date Nov 23, 2023
- Honda Motor Co., Ltd.
- Takashi Matsumoto
- B60 - VEHICLES IN GENERAL
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SAME
- Publication number 20230253366
- Publication date Aug 10, 2023
- Resonac Corporation
- Kohei TANIGUCHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, HEAT-CURABLE RESIN C...
- Publication number 20210269679
- Publication date Sep 2, 2021
- Showa Denko Materials Co., Ltd.
- Kazuhiro YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Display Element
- Publication number 20190235227
- Publication date Aug 1, 2019
- Kazuhiro Yamamoto
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Application
CUTTING BLADE AND CUTTING APPARATUS
- Publication number 20180236691
- Publication date Aug 23, 2018
- Disco Corporation
- Suguru Hiraiwa
- B28 - WORKING CEMENT, CLAY, OR STONE
Information Patent Application
PERMEABILITY EVALUATION METHOD
- Publication number 20170038324
- Publication date Feb 9, 2017
- HITACHI CHEMICAL CO., Ltd.
- Koji SUZUMURA
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Application
PROCESS FOR MANUFACTURING GRAPHITE POWDER FOR LITHIUM SECONDARY BAT...
- Publication number 20150251911
- Publication date Sep 10, 2015
- TOKAI CARBON CO., LTD.
- Kazuhiro Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Hydrogen Concentration Meter
- Publication number 20150160163
- Publication date Jun 11, 2015
- Kazuhiro Yamamoto
- G01 - MEASURING TESTING
Information Patent Application
COMMUNICATION DEVICE
- Publication number 20130310020
- Publication date Nov 21, 2013
- Yamamoto Kazuhiro
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
METHOD FOR PRODUCING A FUEL CELL SEPARATOR
- Publication number 20120161352
- Publication date Jun 28, 2012
- TOKAI CARBON CO., LTD.
- Kazuhiro Yamamoto
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110202296
- Publication date Aug 18, 2011
- Advantest Corporation
- KAZUHIRO YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TESTING METHOD
- Publication number 20110181308
- Publication date Jul 28, 2011
- Advantest Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND TEST METHOD
- Publication number 20110172957
- Publication date Jul 14, 2011
- Advantest Corporation
- KAZUHIRO YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
TIME MEASUREMENT CIRCUIT
- Publication number 20110133973
- Publication date Jun 9, 2011
- Advantest Corporation
- Kazuhiro Yamamoto
- G04 - HOROLOGY
Information Patent Application
MEASURING APPARATUS, PARALLEL MEASURING APPARATUS, TESTING APPARATU...
- Publication number 20110121815
- Publication date May 26, 2011
- Advantest Corporation
- Kazuhiro YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
LOOP TYPE CLOCK ADJUSTMENT CIRCUIT AND TEST DEVICE
- Publication number 20110089983
- Publication date Apr 21, 2011
- Advantest Corporation
- Kazuhiro Fujita
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TEST APPARATUS, DEMODULATION APPARATUS, TEST METHOD, DEMODULATION M...
- Publication number 20100327967
- Publication date Dec 30, 2010
- Advantest Corporation
- Kazuhiro YAMAMOTO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
RING OSCILLATOR
- Publication number 20100327983
- Publication date Dec 30, 2010
- Advantest Corporation
- Kazuhiro Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DELAY CIRCUIT
- Publication number 20100259435
- Publication date Oct 14, 2010
- Advantest Corporation
- Kazuhiro Yamamoto
- G04 - HOROLOGY
Information Patent Application
ELECTRIC DRILL
- Publication number 20100092254
- Publication date Apr 15, 2010
- Kazuhiro Yamamoto
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
LASER SCATTERING DEFECT INSPECTION SYSTEM AND LASER SCATTERING DEFE...
- Publication number 20100085561
- Publication date Apr 8, 2010
- SUMCO CORPORATION
- Eiji KAMIYAMA
- G01 - MEASURING TESTING
Information Patent Application
DEMODULATION APPARATUS, TEST APPARATUS AND ELECTRONIC DEVICE
- Publication number 20100066443
- Publication date Mar 18, 2010
- Advantest Corporation
- Kazuhiro YAMAMOTO
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
D-A CONVERTER AND D-A CONVERTING METHOD
- Publication number 20100026541
- Publication date Feb 4, 2010
- Advantest Corporation
- Kazuhiro YAMAMOTO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
A-D CONVERTER
- Publication number 20100026544
- Publication date Feb 4, 2010
- Advantest Corporation
- Kazuhiro YAMAMOTO
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TRANSMISSION CIRCUIT, CMOS SEMICONDUCTOR DEVICE, AND DESIGN METHOD...
- Publication number 20090060023
- Publication date Mar 5, 2009
- Advantest Corporation
- Kazuhiro Yamamoto
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
TEST APPARATUS
- Publication number 20090048796
- Publication date Feb 19, 2009
- Advantest Corporation
- KAZUHIRO YAMAMOTO
- G01 - MEASURING TESTING
Information Patent Application
ELECTRIC DRILL
- Publication number 20090028652
- Publication date Jan 29, 2009
- Kazuhiro Yamamoto
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Digital circuit semiconductor device, and clock adjusting method
- Publication number 20080180150
- Publication date Jul 31, 2008
- Kazuhiro Yamamoto
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Glass Composition And Process For Producing The Same
- Publication number 20080090717
- Publication date Apr 17, 2008
- Nippon Sheet Glass Company, Limited
- Yukihito Nagashima
- G02 - OPTICS

Kazuhiro Yamamoto

Person

Patents Grantslast 30 patents

Method for manufacturing semiconductor device, heat-curable resin c...

Display element

Permeability evaluation method

Process for manufacturing graphite powder for lithium secondary bat...

Communication device

Test apparatus and testing method

Test apparatus and test method

Method for producing a fuel cell separator

Time measurement circuit

Test apparatus and test method

Measuring apparatus, parallel measuring apparatus, testing apparatu...

Ring oscillator

System and method of two-stepped laser scattering defect inspection

Delay circuit

Loop type clock adjustment circuit and test device

Test apparatus, demodulation apparatus, test method, demodulation m...

A-D converter

Demodulation apparatus, test apparatus and electronic device

D-A converter and D-A converting method

Transmission circuit for transmitting a differential signal having...

Test apparatus

Electric drill

Variable delay circuit, recording medium, logic verification method...

Electric drill

Transmission circuit, CMOS semiconductor device, and design method...

Semiconductor test apparatus

Timing generator and semiconductor test apparatus

Shock absorbing construction for motorcycles

Portable telephone system

Compositions containing novel protein complexes

Patents Applicationslast 30 patents

FILM-LIKE ADHESIVE AND METHOD FOR PRODUCING SAME, INTEGRATED DICING...

HOLDING DEVICE

SEMICONDUCTOR DEVICE AND METHOD FOR PRODUCING SAME

METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, HEAT-CURABLE RESIN C...

Display Element

CUTTING BLADE AND CUTTING APPARATUS

PERMEABILITY EVALUATION METHOD

PROCESS FOR MANUFACTURING GRAPHITE POWDER FOR LITHIUM SECONDARY BAT...

Hydrogen Concentration Meter

COMMUNICATION DEVICE

METHOD FOR PRODUCING A FUEL CELL SEPARATOR

TEST APPARATUS AND TEST METHOD

TEST APPARATUS AND TESTING METHOD

TEST APPARATUS AND TEST METHOD

TIME MEASUREMENT CIRCUIT

MEASURING APPARATUS, PARALLEL MEASURING APPARATUS, TESTING APPARATU...

LOOP TYPE CLOCK ADJUSTMENT CIRCUIT AND TEST DEVICE

TEST APPARATUS, DEMODULATION APPARATUS, TEST METHOD, DEMODULATION M...

RING OSCILLATOR

DELAY CIRCUIT

ELECTRIC DRILL

LASER SCATTERING DEFECT INSPECTION SYSTEM AND LASER SCATTERING DEFE...

DEMODULATION APPARATUS, TEST APPARATUS AND ELECTRONIC DEVICE

D-A CONVERTER AND D-A CONVERTING METHOD

A-D CONVERTER

TRANSMISSION CIRCUIT, CMOS SEMICONDUCTOR DEVICE, AND DESIGN METHOD...

TEST APPARATUS

ELECTRIC DRILL

Digital circuit semiconductor device, and clock adjusting method

Glass Composition And Process For Producing The Same