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Kazuhisa Ikeda
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Kariya, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Integrated sensor device
Patent number
6,267,010
Issue date
Jul 31, 2001
Denso Corporation
Makoto Hatanaka
G01 - MEASURING TESTING
Information
Patent Grant
Electrochemical etching method for silicon substrate having PN junc...
Patent number
6,194,236
Issue date
Feb 27, 2001
Denso Corporation
Minekazu Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Etching method for silicon substrates and semiconductor sensor
Patent number
5,949,118
Issue date
Sep 7, 1999
Nippondenso Co., Ltd.
Minekazu Sakai
G01 - MEASURING TESTING
Information
Patent Grant
Sensor apparatus capable of preventing high frequency noise
Patent number
5,684,428
Issue date
Nov 4, 1997
Nippondenso Co., Ltd.
Hiroshi Nomura
G01 - MEASURING TESTING
Information
Patent Grant
Constitution of an electrode arrangement in a semiconductor element
Patent number
5,554,881
Issue date
Sep 10, 1996
Nippondenso Co., Ltd.
Takahisa Koyasu
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pressure-adjusting device for adjusting output of integrated pressu...
Patent number
5,528,214
Issue date
Jun 18, 1996
Nippondenso Co., Ltd.
Kazuhiko Koga
G01 - MEASURING TESTING
Information
Patent Grant
Method of fabricating an integrated pressure sensor
Patent number
5,421,956
Issue date
Jun 6, 1995
Nippondenso Co., Ltd.
Kazuhiko Koga
G01 - MEASURING TESTING
Information
Patent Grant
Pressure sensor having a sealed water-resistant construction
Patent number
5,386,730
Issue date
Feb 7, 1995
Nippondenso Co., Ltd.
Kazuhisa Ikeda
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor pressure sensor
Patent number
5,289,721
Issue date
Mar 1, 1994
Nippondenso Co., Ltd.
Yukihiko Tanizawa
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor pressure sensor
Patent number
4,838,089
Issue date
Jun 13, 1989
Nippondenso Co., Ltd.
Hiroshi Okada
G01 - MEASURING TESTING