Kazuhito Hayasaka

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Test system and test method
- Patent number 11,385,284
- Issue date Jul 12, 2022
- Kioxia Corporation
- Kazuhito Hayasaka
- G01 - MEASURING TESTING
Information Patent Grant
Tester calibration device and tester calibration method
- Patent number 10,838,033
- Issue date Nov 17, 2020
- TOSHIBA MEMORY CORPORATION
- Kazuhito Hayasaka
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Probe card and method for selecting the same
- Patent number 8,421,492
- Issue date Apr 16, 2013
- Kabushiki Kaisha Toshiba
- Kazuhito Hayasaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CASSETTE HOUSING, PROBER, SERVER RACK, AND STORAGE SYSTEM
- Publication number 20240014061
- Publication date Jan 11, 2024
- KIOXIA Corporation
- Tatsuro HITOMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STORAGE SYSTEM
- Publication number 20240014062
- Publication date Jan 11, 2024
- KIOXIA Corporation
- Tatsuro HITOMI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
WAFER AND PROBER
- Publication number 20230324455
- Publication date Oct 12, 2023
- KIOXIA Corporation
- Tatsuro HITOMI
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM AND TEST METHOD
- Publication number 20210072308
- Publication date Mar 11, 2021
- Kioxia Corporation
- Kazuhito HAYASAKA
- G01 - MEASURING TESTING
Information Patent Application
TESTER CALIBRATION DEVICE AND TESTER CALIBRATION METHOD
- Publication number 20190285715
- Publication date Sep 19, 2019
- Toshiba Memory Corporation
- Kazuhito Hayasaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE CARD AND METHOD FOR SELECTING THE SAME
- Publication number 20090289650
- Publication date Nov 26, 2009
- Kabushiki Kaisha Toshiba
- Kazuhito Hayasaka
- G01 - MEASURING TESTING