Kazuki HORITA

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Hamamatsu-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Fermentation state monitoring apparatus and fermentation state moni...
- Patent number 11,293,859
- Issue date Apr 5, 2022
- HAMAMATSU PHOTONICS K.K.
- Kouichiro Akiyama
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave spectroscopic measurement apparatus and terahertz wa...
- Patent number 10,895,504
- Issue date Jan 19, 2021
- Hamamatsu Photonics K.K.
- Takashi Yasuda
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and optical measurement method
- Patent number 10,809,189
- Issue date Oct 20, 2020
- Hamamatsu Photonics K.K.
- Kazuki Horita
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave spectroscopic measurement device
- Patent number 10,697,891
- Issue date Jun 30, 2020
- Hamamatsu Photonics K.K.
- Atsushi Nakanishi
- G01 - MEASURING TESTING
Information Patent Grant
Terahertz wave temporal waveform acquistion apparatus
- Patent number 9,417,183
- Issue date Aug 16, 2016
- Hamamatsu Photonics K.K.
- Atsushi Nakanishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ATTENUATED TOTAL REFLECTANCE SPECTROSCOPY APPARATUS, AND ATTENUATED...
- Publication number 20240175811
- Publication date May 30, 2024
- Hamamatsu Photonics K.K.
- Kazuki HORITA
- G01 - MEASURING TESTING
Information Patent Application
FERMENTATION STATE MONITORING APPARATUS AND FERMENTATION STATE MONI...
- Publication number 20200173916
- Publication date Jun 4, 2020
- HAMAMATSU PHOTONICS K. K.
- Kouichiro AKIYAMA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT DEVICE AND OPTICAL MEASUREMENT METHOD
- Publication number 20190271642
- Publication date Sep 5, 2019
- HAMAMATSU PHOTONICS K. K.
- Kazuki HORITA
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE SPECTROSCOPIC MEASUREMENT DEVICE
- Publication number 20190234871
- Publication date Aug 1, 2019
- HAMAMATSU PHOTONICS K. K.
- Atsushi NAKANISHI
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE SPECTROSCOPIC MEASUREMENT APPARATUS AND TERAHERTZ WA...
- Publication number 20190025124
- Publication date Jan 24, 2019
- HAMAMATSU PHOTONICS K. K.
- Takashi YASUDA
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ WAVE TEMPORAL WAVEFORM ACQUISTION APPARATUS
- Publication number 20160202179
- Publication date Jul 14, 2016
- HAMAMATSU PHOTONICS K. K.
- Atsushi NAKANISHI
- G01 - MEASURING TESTING