Kazuki Ikeda

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Measurement system and method of setting parameter of charged parti...
- Patent number 12,198,894
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Hiroshi Oinuma
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-level synthesis device and high-level synthesis method
- Patent number 12,106,029
- Issue date Oct 1, 2024
- Hitachi, Ltd.
- Tomoharu Nagashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Charged particle beam device and operation method therefor
- Patent number 11,961,701
- Issue date Apr 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Tomoharu Nagashima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement device and signal processing method
- Patent number 11,842,881
- Issue date Dec 12, 2023
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Medium sensor device and monitoring system
- Patent number 11,199,511
- Issue date Dec 14, 2021
- Hitachi, Ltd.
- Kazuki Ikeda
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Charged-particle beam system
- Patent number 10,872,745
- Issue date Dec 22, 2020
- HITACHI HIGH-TECH CORPORATION
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,818,470
- Issue date Oct 27, 2020
- HITACHI HIGH-TECH CORPORATION
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image forming apparatus
- Patent number 10,768,547
- Issue date Sep 8, 2020
- Konica Minolta, Inc.
- Kazuki Ikeda
- G02 - OPTICS
Information Patent Grant
Image forming apparatus
- Patent number 10,698,333
- Issue date Jun 30, 2020
- Konica Minolta, Inc.
- Yoshihiro Inagaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Structural color changeable material and strain detection apparatus
- Patent number 10,655,953
- Issue date May 19, 2020
- Konica Minolta, Inc.
- Kazuki Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Micro lens array, optical writing device, and image forming device
- Patent number 10,578,779
- Issue date Mar 3, 2020
- Konica Minolta, Inc.
- Makoto Ooki
- G02 - OPTICS
Information Patent Grant
Charged particle beam device with transient signal correction durin...
- Patent number 10,559,447
- Issue date Feb 11, 2020
- Hitachi High-Technologies Corporation
- Ryo Kadoi
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam device
- Patent number 10,424,459
- Issue date Sep 24, 2019
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device and image forming method using same
- Patent number 10,373,797
- Issue date Aug 6, 2019
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strain sensor and recording medium
- Patent number 10,281,345
- Issue date May 7, 2019
- Konica Minolta, Inc.
- Hideo Uemura
- G01 - MEASURING TESTING
Information Patent Grant
Optical writing device, image forming device, and manufacturing met...
- Patent number 10,211,260
- Issue date Feb 19, 2019
- Konica Minolta, Inc.
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Drive device, method of controlling strain and computer readable me...
- Patent number 10,145,486
- Issue date Dec 4, 2018
- Konica Minolta, Inc.
- Kazuki Ikeda
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Charged particle beam apparatus and image forming method of charged...
- Patent number 9,859,094
- Issue date Jan 2, 2018
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 9,679,740
- Issue date Jun 13, 2017
- Hitachi High-Technologies Corporation
- Wen Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus, image forming method using a charg...
- Patent number 9,633,818
- Issue date Apr 25, 2017
- Hitachi High-Technologies Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and image generation method
- Patent number 9,478,392
- Issue date Oct 25, 2016
- Hitachi High-Technologies Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Strain sensor and method of measuring strain amount
- Patent number 9,423,243
- Issue date Aug 23, 2016
- Konica Minolta, Inc.
- Kazuki Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Image forming apparatus
- Patent number 8,953,194
- Issue date Feb 10, 2015
- Konica Minolta, Inc.
- Akira Yamamura
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT SYSTEM AND METHOD OF SETTING PARAMETER OF CHARGED PARTI...
- Publication number 20230059414
- Publication date Feb 23, 2023
- HITACHI HIGH-TECH CORPORATION
- Hiroshi OINUMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH-LEVEL SYNTHESIS DEVICE AND HIGH-LEVEL SYNTHESIS METHOD
- Publication number 20220366111
- Publication date Nov 17, 2022
- Hitachi, Ltd
- Tomoharu NAGASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20220270847
- Publication date Aug 25, 2022
- Hitachi High-Tech Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND OPERATION METHOD THEREFOR
- Publication number 20220189729
- Publication date Jun 16, 2022
- HITACHI HIGH-TECH CORPORATION
- Tomoharu NAGASHIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT DEVICE AND SIGNAL PROCESSING METHOD
- Publication number 20220068597
- Publication date Mar 3, 2022
- Hitachi High-Tech Corporation
- Akio Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MEDIUM SENSOR DEVICE AND MONITORING SYSTEM
- Publication number 20210109037
- Publication date Apr 15, 2021
- Hitachi, Ltd
- Kazuki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE FORMING APPARATUS
- Publication number 20200133157
- Publication date Apr 30, 2020
- Konica Minolta, Inc.
- Yoshihiro Inagaki
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
IMAGE FORMING APPARATUS
- Publication number 20200117110
- Publication date Apr 16, 2020
- Konica Minolta, Inc.
- Kazuki IKEDA
- G02 - OPTICS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20200043695
- Publication date Feb 6, 2020
- Hitachi High-Technologies Corporation
- Kazuki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED-PARTICLE BEAM SYSTEM
- Publication number 20200020504
- Publication date Jan 16, 2020
- Hitachi High-Technologies Corporation
- Akio YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO LENS ARRAY, OPTICAL WRITING DEVICE, AND IMAGE FORMING DEVICE
- Publication number 20190285779
- Publication date Sep 19, 2019
- Konica Minolta, Inc.
- Makoto Ooki
- G02 - OPTICS
Information Patent Application
OPTICAL WRITING DEVICE, IMAGE FORMING DEVICE, AND MANUFACTURING MET...
- Publication number 20180350882
- Publication date Dec 6, 2018
- Konica Minolta, Inc.
- Kazuki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE AND IMAGE FORMING METHOD USING SAME
- Publication number 20180247790
- Publication date Aug 30, 2018
- Hitachi High-Technologies Corporation
- Wen LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAIN SENSOR AND RECORDING MEDIUM
- Publication number 20180180496
- Publication date Jun 28, 2018
- Konica Minolta, Inc.
- Hideo UEMURA
- G01 - MEASURING TESTING
Information Patent Application
STRAIN SENSOR AND RECORDING MEDIUM
- Publication number 20180113036
- Publication date Apr 26, 2018
- Konica Minolta, Inc.
- Hideo Uemura
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20180106610
- Publication date Apr 19, 2018
- Hitachi High-Technologies Corporation
- Ryo KADOI
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURAL COLOR CHANGEABLE MATERIAL AND STRAIN DETECTION APPARATUS
- Publication number 20180066937
- Publication date Mar 8, 2018
- Konica Minolta, Inc.
- Kazuki IKEDA
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20170271121
- Publication date Sep 21, 2017
- Hitachi High-Technologies Corporation
- Wen LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Drive Device, Method of Controlling Strain and Computer Readable Me...
- Publication number 20170227934
- Publication date Aug 10, 2017
- Konica Minolta, Inc.
- Kazuki Ikeda
- G05 - CONTROLLING REGULATING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND IMAGE FORMING METHOD OF CHARGED...
- Publication number 20170207061
- Publication date Jul 20, 2017
- Hitachi High-Technologies Corporation
- Wen LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
GAS DETECTION METHOD AND GAS DETECTION DEVICE
- Publication number 20170089832
- Publication date Mar 30, 2017
- Konica Minolta, Inc.
- Hideo UEMURA
- G01 - MEASURING TESTING
Information Patent Application
Charged Particle Beam Device
- Publication number 20160329186
- Publication date Nov 10, 2016
- Hitachi High-Technologies Corporation
- Wen LI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus, Image Forming Method Using a Charg...
- Publication number 20160276128
- Publication date Sep 22, 2016
- Hitachi High-Technologies Corporation
- Kazuki IKEDA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRAIN SENSOR AND METHOD OF MEASURING STRAIN AMOUNT
- Publication number 20160252345
- Publication date Sep 1, 2016
- Konica Minolta, Inc.
- Kazuki IKEDA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND IMAGE GENERATION METHOD
- Publication number 20160064182
- Publication date Mar 3, 2016
- Hitachi High-Technologies Corporation
- Kazuki Ikeda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE FORMING APPARATUS
- Publication number 20140168725
- Publication date Jun 19, 2014
- Konica Minolta, Inc.
- Akira YAMAMURA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Kazuki Ikeda

Person

Patents Grantslast 30 patents

Measurement system and method of setting parameter of charged parti...

High-level synthesis device and high-level synthesis method

Charged particle beam device and operation method therefor

Measurement device and signal processing method

Medium sensor device and monitoring system

Charged-particle beam system

Charged particle beam device

Image forming apparatus

Image forming apparatus

Structural color changeable material and strain detection apparatus

Micro lens array, optical writing device, and image forming device

Charged particle beam device with transient signal correction durin...

Charged particle beam device

Charged particle beam device and image forming method using same

Strain sensor and recording medium

Optical writing device, image forming device, and manufacturing met...

Drive device, method of controlling strain and computer readable me...

Charged particle beam apparatus and image forming method of charged...

Charged particle beam device

Charged particle beam apparatus, image forming method using a charg...

Charged particle beam apparatus and image generation method

Strain sensor and method of measuring strain amount

Image forming apparatus

Patents Applicationslast 30 patents

MEASUREMENT SYSTEM AND METHOD OF SETTING PARAMETER OF CHARGED PARTI...

HIGH-LEVEL SYNTHESIS DEVICE AND HIGH-LEVEL SYNTHESIS METHOD

CHARGED PARTICLE BEAM DEVICE

CHARGED PARTICLE BEAM DEVICE AND OPERATION METHOD THEREFOR

MEASUREMENT DEVICE AND SIGNAL PROCESSING METHOD

MEDIUM SENSOR DEVICE AND MONITORING SYSTEM

IMAGE FORMING APPARATUS

IMAGE FORMING APPARATUS

CHARGED PARTICLE BEAM DEVICE

CHARGED-PARTICLE BEAM SYSTEM

MICRO LENS ARRAY, OPTICAL WRITING DEVICE, AND IMAGE FORMING DEVICE

OPTICAL WRITING DEVICE, IMAGE FORMING DEVICE, AND MANUFACTURING MET...

CHARGED PARTICLE BEAM DEVICE AND IMAGE FORMING METHOD USING SAME

STRAIN SENSOR AND RECORDING MEDIUM

STRAIN SENSOR AND RECORDING MEDIUM

CHARGED PARTICLE BEAM DEVICE

STRUCTURAL COLOR CHANGEABLE MATERIAL AND STRAIN DETECTION APPARATUS

Charged Particle Beam Device

Drive Device, Method of Controlling Strain and Computer Readable Me...

CHARGED PARTICLE BEAM APPARATUS AND IMAGE FORMING METHOD OF CHARGED...

GAS DETECTION METHOD AND GAS DETECTION DEVICE

Charged Particle Beam Device

Charged Particle Beam Apparatus, Image Forming Method Using a Charg...

STRAIN SENSOR AND METHOD OF MEASURING STRAIN AMOUNT

CHARGED PARTICLE BEAM APPARATUS AND IMAGE GENERATION METHOD

IMAGE FORMING APPARATUS