Kazuki Negishi

Person

Beaverton, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Probe systems including imaging devices with objective lens isolato...
- Patent number 11,874,301
- Issue date Jan 16, 2024
- FormFactor, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems and methods for testing a device under test
- Patent number 11,346,883
- Issue date May 31, 2022
- FormFactor, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems and methods for characterizing optical coupling betwe...
- Patent number 11,313,936
- Issue date Apr 26, 2022
- FormFactor, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems and methods including electric contact detection
- Patent number 11,181,550
- Issue date Nov 23, 2021
- FormFactor, lnc.
- Sia Choon Beng
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems for optically probing a device under test and methods...
- Patent number 11,131,709
- Issue date Sep 28, 2021
- FormFactor, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Grant
Calibration chucks for optical probe systems, optical probe systems...
- Patent number 11,047,795
- Issue date Jun 29, 2021
- FormFactor, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Probes with fiducial targets, probe systems including the same, and...
- Patent number 10,877,070
- Issue date Dec 29, 2020
- FormFactor Beaverton, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems and methods for calibrating capacitive height sensing...
- Patent number 10,809,048
- Issue date Oct 20, 2020
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Probe systems for testing a device under test
- Patent number 10,698,002
- Issue date Jun 30, 2020
- FormFactor Beaverton, Inc.
- Christopher Storm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Probe systems and methods including electric contact detection
- Patent number 10,330,703
- Issue date Jun 25, 2019
- FormFactor Beaverton, Inc.
- Sia Choon Beng
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for on-wafer dynamic testing of electronic devices
- Patent number 10,281,518
- Issue date May 7, 2019
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe systems
- Patent number 10,060,950
- Issue date Aug 28, 2018
- FormFactor Beaverton, Inc.
- Michael E Simmons
- G01 - MEASURING TESTING
Information Patent Grant
High voltage chuck for a probe station
- Patent number 10,062,597
- Issue date Aug 28, 2018
- FormFactor Beaverton, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Grant
High voltage chuck for a probe station
- Patent number 9,741,599
- Issue date Aug 22, 2017
- Cascade Microtech, Inc.
- Michael E. Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High voltage chuck for a probe station
- Patent number 9,506,973
- Issue date Nov 29, 2016
- Cascade Microtech, Inc.
- Michael E. Simmons
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for simultaneous optical testing of a plurality...
- Patent number 8,823,406
- Issue date Sep 2, 2014
- Cascade Micotech, Inc.
- Bryan Bolt
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus for measuring a characteristic of a device under test
- Patent number 8,319,503
- Issue date Nov 27, 2012
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Grant
Low noise connector with cables having a center, middle and outer c...
- Patent number 8,167,648
- Issue date May 1, 2012
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE SYSTEMS AND METHODS FOR TESTING A DEVICE UNDER TEST
- Publication number 20210132145
- Publication date May 6, 2021
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATO...
- Publication number 20210132115
- Publication date May 6, 2021
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS FOR CHARACTERIZING OPTICAL COUPLING BETWE...
- Publication number 20210096206
- Publication date Apr 1, 2021
- FormFactor Beaverton, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS FOR OPTICALLY PROBING A DEVICE UNDER TEST AND METHODS...
- Publication number 20210096176
- Publication date Apr 1, 2021
- FormFactor Beaverton, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Application
CALIBRATION CHUCKS FOR OPTICAL PROBE SYSTEMS, OPTICAL PROBE SYSTEMS...
- Publication number 20200378888
- Publication date Dec 3, 2020
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS FOR CALIBRATING CAPACITIVE HEIGHT SENSING...
- Publication number 20200217638
- Publication date Jul 9, 2020
- FormFactor Beaverton, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION
- Publication number 20190277885
- Publication date Sep 12, 2019
- FormFactor Beaverton, Inc.
- Sia Choon Beng
- G01 - MEASURING TESTING
Information Patent Application
PROBES WITH FIDUCIAL TARGETS, PROBE SYSTEMS INCLUDING THE SAME, AND...
- Publication number 20190227102
- Publication date Jul 25, 2019
- FormFactor Beaverton, Inc.
- Joseph George Frankel
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEMS FOR TESTING A DEVICE UNDER TEST
- Publication number 20190101567
- Publication date Apr 4, 2019
- FormFactor Beaverton, Inc.
- Christopher Storm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION
- Publication number 20180284155
- Publication date Oct 4, 2018
- Cascade Microtech, Inc.
- Sia Choon Beng
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE CHUCK FOR A PROBE STATION
- Publication number 20170338142
- Publication date Nov 23, 2017
- Cascade Microtech, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
SHIELDED PROBE SYSTEMS
- Publication number 20170205446
- Publication date Jul 20, 2017
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE CHUCK FOR A PROBE STATION
- Publication number 20160195579
- Publication date Jul 7, 2016
- Cascade Microtech, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES
- Publication number 20150241472
- Publication date Aug 27, 2015
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
HIGH VOLTAGE CHUCK FOR A PROBE STATION
- Publication number 20130075982
- Publication date Mar 28, 2013
- Cascade Microtech, Inc.
- Michael E. Simmons
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SIMULTANEOUS OPTICAL TESTING OF A PLURALITY...
- Publication number 20120098559
- Publication date Apr 26, 2012
- Cascade Microtech, Inc.
- Bryan Bolt
- G01 - MEASURING TESTING
Information Patent Application
PROBE STATION WITH IMPROVED INTERCONNECTION
- Publication number 20110207370
- Publication date Aug 25, 2011
- Kazuki Negishi
- G01 - MEASURING TESTING
Information Patent Application
Test system for flicker noise
- Publication number 20100127714
- Publication date May 27, 2010
- Cascade Microtech, Inc.
- Kazuki Negishi
- G01 - MEASURING TESTING

Kazuki Negishi

Person

Patents Grantslast 30 patents

Probe systems including imaging devices with objective lens isolato...

Probe systems and methods for testing a device under test

Probe systems and methods for characterizing optical coupling betwe...

Probe systems and methods including electric contact detection

Probe systems for optically probing a device under test and methods...

Calibration chucks for optical probe systems, optical probe systems...

Probes with fiducial targets, probe systems including the same, and...

Probe systems and methods for calibrating capacitive height sensing...

Probe systems for testing a device under test

Probe systems and methods including electric contact detection

Systems and methods for on-wafer dynamic testing of electronic devices

Shielded probe systems

High voltage chuck for a probe station

High voltage chuck for a probe station

High voltage chuck for a probe station

Systems and methods for simultaneous optical testing of a plurality...

Test apparatus for measuring a characteristic of a device under test

Low noise connector with cables having a center, middle and outer c...

Patents Applicationslast 30 patents

PROBE SYSTEMS AND METHODS FOR TESTING A DEVICE UNDER TEST

PROBE SYSTEMS INCLUDING IMAGING DEVICES WITH OBJECTIVE LENS ISOLATO...

PROBE SYSTEMS AND METHODS FOR CHARACTERIZING OPTICAL COUPLING BETWE...

PROBE SYSTEMS FOR OPTICALLY PROBING A DEVICE UNDER TEST AND METHODS...

CALIBRATION CHUCKS FOR OPTICAL PROBE SYSTEMS, OPTICAL PROBE SYSTEMS...

PROBE SYSTEMS AND METHODS FOR CALIBRATING CAPACITIVE HEIGHT SENSING...

PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION

PROBES WITH FIDUCIAL TARGETS, PROBE SYSTEMS INCLUDING THE SAME, AND...

PROBE SYSTEMS FOR TESTING A DEVICE UNDER TEST

PROBE SYSTEMS AND METHODS INCLUDING ELECTRIC CONTACT DETECTION

HIGH VOLTAGE CHUCK FOR A PROBE STATION

SHIELDED PROBE SYSTEMS

HIGH VOLTAGE CHUCK FOR A PROBE STATION

SYSTEMS AND METHODS FOR ON-WAFER DYNAMIC TESTING OF ELECTRONIC DEVICES

HIGH VOLTAGE CHUCK FOR A PROBE STATION

SYSTEMS AND METHODS FOR SIMULTANEOUS OPTICAL TESTING OF A PLURALITY...

PROBE STATION WITH IMPROVED INTERCONNECTION

Test system for flicker noise