Kazuki Shigeta

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Failure diagnostic apparatus and failure diagnostic method
- Patent number 11,193,974
- Issue date Dec 7, 2021
- Renesas Electronics Corporation
- Yukihisa Funatsu
- G01 - MEASURING TESTING
Information Patent Grant
Failure propagation path estimate system
- Patent number 7,120,829
- Issue date Oct 10, 2006
- NEC Electronics Corporation
- Kazuki Shigeta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fault analyzing system, method for pursuing fault origin and inform...
- Patent number 6,915,494
- Issue date Jul 5, 2005
- NEC Electronics Corporation
- Kazuki Shigeta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for inferring fault propagation paths in combinat...
- Patent number 6,857,094
- Issue date Feb 15, 2005
- NEC Electronics Corporation
- Kazuki Shigeta
- G01 - MEASURING TESTING
Information Patent Grant
System and method for evaluating the location of a failure in a log...
- Patent number 6,697,981
- Issue date Feb 24, 2004
- NEC Corporation
- Kazuki Shigeta
- G01 - MEASURING TESTING
Information Patent Grant
Fault propagation path estimating method, fault propagation path es...
- Patent number 6,560,738
- Issue date May 6, 2003
- NEC Electronics Corporation
- Kazuki Shigeta
- G01 - MEASURING TESTING
Information Patent Grant
Failure analysis system, method for managing estimated logic status...
- Patent number 6,401,219
- Issue date Jun 4, 2002
- NEC Corporation
- Kazuki Shigeta
- G01 - MEASURING TESTING
Information Patent Grant
Error propagation path extraction system, error propagation path ex...
- Patent number 6,301,685
- Issue date Oct 9, 2001
- NEC Corporation
- Kazuki Shigeta
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
FAILURE DIAGNOSTIC APPARATUS AND FAILURE DIAGNOSTIC METHOD
- Publication number 20210255242
- Publication date Aug 19, 2021
- RENESAS ELECTRONICS CORPORATION
- Yukihisa FUNATSU
- G01 - MEASURING TESTING
Information Patent Application
Failure propagation path estimate system
- Publication number 20030066000
- Publication date Apr 3, 2003
- NEC Corporation
- Kazuki Shigeta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and system for inferring fault propagation paths in combinat...
- Publication number 20020112207
- Publication date Aug 15, 2002
- NEC Corporation
- Kazuki Shigeta
- G01 - MEASURING TESTING
Information Patent Application
Fault analyzing system, method for pursuing fault origin and inform...
- Publication number 20010049802
- Publication date Dec 6, 2001
- Kazuki Shigeta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for evaluating the location of a failure in a log...
- Publication number 20010011360
- Publication date Aug 2, 2001
- Kazuki Shigeta
- G01 - MEASURING TESTING

Kazuki Shigeta

Person

Patents Grantslast 30 patents

Failure diagnostic apparatus and failure diagnostic method

Failure propagation path estimate system

Fault analyzing system, method for pursuing fault origin and inform...

Method and system for inferring fault propagation paths in combinat...

System and method for evaluating the location of a failure in a log...

Fault propagation path estimating method, fault propagation path es...

Failure analysis system, method for managing estimated logic status...

Error propagation path extraction system, error propagation path ex...

Patents Applicationslast 30 patents

FAILURE DIAGNOSTIC APPARATUS AND FAILURE DIAGNOSTIC METHOD

Failure propagation path estimate system

Method and system for inferring fault propagation paths in combinat...

Fault analyzing system, method for pursuing fault origin and inform...

System and method for evaluating the location of a failure in a log...