Kazuki Yagi

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam apparatus
- Patent number 11,776,787
- Issue date Oct 3, 2023
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope and method of adjusting optical sy...
- Patent number 11,742,176
- Issue date Aug 29, 2023
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 11,676,796
- Issue date Jun 13, 2023
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample holder and electron microscope
- Patent number 10,504,690
- Issue date Dec 10, 2019
- Jeol Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid module and methods for manufacturing and mounting thereof
- Patent number 6,163,456
- Issue date Dec 19, 2000
- Taiyo Yuden, Co., Ltd.
- Kazutaka Suzuki
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Charged Particle Beam Apparatus and Control Method for Charged Part...
- Publication number 20230290607
- Publication date Sep 14, 2023
- JEOL Ltd.
- Takeo Sasaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device and Image Generation Method
- Publication number 20230072991
- Publication date Mar 9, 2023
- JEOL Ltd.
- Hiroki Hashiguchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Apparatus
- Publication number 20220216033
- Publication date Jul 7, 2022
- JEOL Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope and Method of Adjusting Optical Sy...
- Publication number 20220172924
- Publication date Jun 2, 2022
- JEOL Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Charged Particle Beam Device
- Publication number 20220084783
- Publication date Mar 17, 2022
- JEOL Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sample Holder and Electron Microscope
- Publication number 20180374671
- Publication date Dec 27, 2018
- JEOL Ltd.
- Kazuki Yagi
- H01 - BASIC ELECTRIC ELEMENTS