Kazumasa KUROYANAGI

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Kanagawa, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe resistance measurement method and semiconductor device with p...
- Patent number 9,217,770
- Issue date Dec 22, 2015
- Renesas Electronics Corporation
- Shigetomi Michimata
- G01 - MEASURING TESTING
Information Patent Grant
Probe resistance measurement method and semiconductor device with p...
- Patent number 8,278,935
- Issue date Oct 2, 2012
- Renesas Electronics Corporation
- Shigetomi Michimata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device with an opening for cutting a fuse
- Patent number 7,791,111
- Issue date Sep 7, 2010
- NEC Electronics Corporation
- Kazumasa Kuroyanagi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
PROBE RESISTANCE MEASUREMENT METHOD AND SEMICONDUCTOR DEVICE WITH P...
- Publication number 20130001551
- Publication date Jan 3, 2013
- Renesas Electronics Corporation
- Shigetomi MICHIMATA
- G01 - MEASURING TESTING
Information Patent Application
Probe resistance measurement method and semiconductor device with p...
- Publication number 20090008641
- Publication date Jan 8, 2009
- NEC Electronics Corporation
- Shigetomi Michimata
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device
- Publication number 20080061378
- Publication date Mar 13, 2008
- NEC Electronics Corporation
- Kazumasa KUROYANAGI
- H01 - BASIC ELECTRIC ELEMENTS