Kazumasa NAGANO

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Toyama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor laser element, testing method, and testing device
- Patent number 12,107,393
- Issue date Oct 1, 2024
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazumasa Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor laser element, testing method, and testing device
- Patent number 11,824,326
- Issue date Nov 21, 2023
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazumasa Nagano
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Submount for semiconductor laser device on heat assisted recording...
- Patent number 11,171,465
- Issue date Nov 9, 2021
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Shinichi Ijima
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR LASER ELEMENT, TESTING METHOD, AND TESTING DEVICE
- Publication number 20240055830
- Publication date Feb 15, 2024
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazumasa NAGANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR LASER ELEMENT, TESTING METHOD, AND TESTING DEVICE
- Publication number 20210151954
- Publication date May 20, 2021
- NUVOTON TECHNOLOGY CORPORATION JAPAN
- Kazumasa NAGANO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SUBMOUNT, SEMICONDUCTOR LASER DEVICE AND HEAT ASSISTED HARD DISK DE...
- Publication number 20200169059
- Publication date May 28, 2020
- Panasonic Intellectual Property Management Co., Ltd.
- Shinichi IJIMA
- G11 - INFORMATION STORAGE