Kazumasa Takada

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Katsuta, JP

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Patents Grantslast 30 patents

Information Patent Grant
Planar lightwave fourier-transform spectrometer measurement includi...
- Patent number 8,406,580
- Issue date Mar 26, 2013
- Aidi Corporation
- Kazumasa Takada
- G01 - MEASURING TESTING
Information Patent Grant
Low-coherence reflectometer with polarization control
- Patent number 6,775,005
- Issue date Aug 10, 2004
- Ando Electric Co., Ltd.
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Grant
Low coherent reflectometer
- Patent number 6,760,110
- Issue date Jul 6, 2004
- Ando Electric Co., Ltd.
- Syoichi Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Polarization-independent reflectometry and polarization-independent...
- Patent number 6,476,919
- Issue date Nov 5, 2002
- Ando Electric Co., Ltd.
- Tohru Mori
- G01 - MEASURING TESTING
Information Patent Grant
Wavelength division multi/demultiplexer
- Patent number 6,278,813
- Issue date Aug 21, 2001
- Nippon Telegraph and Telephone Corporation
- Kazumasa Takada
- G02 - OPTICS
Information Patent Grant
Guided-wave circuit with optical characteristics adjusting plate, m...
- Patent number 5,940,548
- Issue date Aug 17, 1999
- Nippon Telegraph & Telephone Corporation
- Hiroaki Yamada
- G02 - OPTICS
Information Patent Grant
Superluminescent diode
- Patent number 4,901,123
- Issue date Feb 13, 1990
- Nippon Telegraph & Telephone Corporation
- Yoshio Noguchi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PLANAR LIGHTWAVE FOURIER-TRANSFORM SPECTROMETER MEASUREMENT INCLUDI...
- Publication number 20120050744
- Publication date Mar 1, 2012
- GUNMA UNIVERSITY
- Kazumasa TAKADA
- G01 - MEASURING TESTING
Information Patent Application
Low-coherence reflectometer
- Publication number 20020118363
- Publication date Aug 29, 2002
- Fumio Akikuni
- G01 - MEASURING TESTING
Information Patent Application
Low coherent reflectometer
- Publication number 20020060794
- Publication date May 23, 2002
- ANDO ELECTRIC CO., LTD.
- Syoichi Aoki
- G01 - MEASURING TESTING