Kazumasa Tanaka

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection system, inspection method, and program
- Patent number 8,629,979
- Issue date Jan 14, 2014
- Hitachi High-Technologies Corporation
- Kazumasa Tanaka
- G01 - MEASURING TESTING
Information Patent Grant
Examining apparatus and examining method
- Patent number 8,593,625
- Issue date Nov 26, 2013
- Hitachi High-Technologies Corporation
- Kazumasa Tanaka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION SYSTEM, INSPECTION METHOD, AND PROGRAM
- Publication number 20130148116
- Publication date Jun 13, 2013
- Hitachi High-Technologies Corporation
- Kazumasa Tanaka
- G01 - MEASURING TESTING
Information Patent Application
EXAMINING APPARATUS AND EXAMINING METHOD
- Publication number 20110304848
- Publication date Dec 15, 2011
- Kazumasa Tanaka
- G01 - MEASURING TESTING