Kazumi Hatayama

Person

Hachiouji, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor integrated circuit and its analyzing method
- Patent number 7,036,060
- Issue date Apr 25, 2006
- Hitachi, Ltd.
- Michinobu Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Test method of semiconductor intergrated circuit and test pattern g...
- Patent number 6,922,803
- Issue date Jul 26, 2005
- Hitachi, Ltd.
- Michinobu Nakao
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device having self test function
- Patent number 6,640,198
- Issue date Oct 28, 2003
- Hitachi, Ltd.
- Masahide Miyazaki
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor integrated circuit and method of designing the same
- Patent number 6,484,294
- Issue date Nov 19, 2002
- Hitachi, Ltd.
- Yoshikazu Kiyoshige
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for making test data and method thereof
- Patent number 6,317,853
- Issue date Nov 13, 2001
- Hitachi, Ltd.
- Kazunori Hikone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of analyzing logic circuit test points, apparatus for analyz...
- Patent number 6,038,691
- Issue date Mar 14, 2000
- Hitachi, Ltd.
- Michinobu Nakao
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for making test data and method thereof
- Patent number 6,032,280
- Issue date Feb 29, 2000
- Hitachi, Ltd.
- Kazunori Hikone
Information Patent Grant
Logic circuit with additional circuit for carrying out delay test
- Patent number 5,329,532
- Issue date Jul 12, 1994
- Hitachi, Ltd.
- Mitsuji Ikeda
- G01 - MEASURING TESTING
Information Patent Grant
Memory incorporating logic LSI and method for testing the same LSI
- Patent number 4,956,818
- Issue date Sep 11, 1990
- Hitachi, Ltd.
- Kazumi Hatayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for diagnosing a LSI chip
- Patent number 4,710,930
- Issue date Dec 1, 1987
- Hitachi, Ltd.
- Kazumi Hatayama
- G11 - INFORMATION STORAGE
Information Patent Grant
Integrated circuit device and method of diagnosing the same
- Patent number 4,613,970
- Issue date Sep 23, 1986
- Hitachi, Ltd.
- Ikuro Masuda
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Semiconductor integrated circuit and its analyzing method
- Publication number 20030200492
- Publication date Oct 23, 2003
- Michinobu Nakao
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor integrated circuit with built-in test function
- Publication number 20030070118
- Publication date Apr 10, 2003
- Hitachi, Ltd.
- Michinobu Nakao
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device having self test function
- Publication number 20020128794
- Publication date Sep 12, 2002
- Masahide Miyazaki
- G11 - INFORMATION STORAGE
Information Patent Application
Test method of semiconductor intergrated circuit and test pattern g...
- Publication number 20020073373
- Publication date Jun 13, 2002
- Michinobu Nakao
- G01 - MEASURING TESTING

Kazumi Hatayama

Person

Patents Grantslast 30 patents

Semiconductor integrated circuit and its analyzing method

Test method of semiconductor intergrated circuit and test pattern g...

Semiconductor device having self test function

Semiconductor integrated circuit and method of designing the same

Apparatus for making test data and method thereof

Method of analyzing logic circuit test points, apparatus for analyz...

Apparatus for making test data and method thereof

Logic circuit with additional circuit for carrying out delay test

Memory incorporating logic LSI and method for testing the same LSI

Method and apparatus for diagnosing a LSI chip

Integrated circuit device and method of diagnosing the same

Patents Applicationslast 30 patents

Semiconductor integrated circuit and its analyzing method

Semiconductor integrated circuit with built-in test function

Semiconductor device having self test function

Test method of semiconductor intergrated circuit and test pattern g...