Kazumi Koyama

Person

Kanagawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Tristate output buffer with high-impedance state responsive to incr...
- Patent number 4,498,022
- Issue date Feb 5, 1985
- Fujitsu Limited
- Kazumi Koyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Field programmable device with circuitry for detecting poor insulat...
- Patent number 4,459,694
- Issue date Jul 10, 1984
- Fujitsu Limited
- Kouji Ueno
- G11 - INFORMATION STORAGE
Information Patent Grant
Field programmable device with internal dynamic test circuit
- Patent number 4,429,388
- Issue date Jan 31, 1984
- Fujitsu Limited
- Toshitaka Fukushima
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device
- Patent number 4,424,582
- Issue date Jan 3, 1984
- Fujitsu Limited
- Toshitaka Fukushima
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable read-only memory device
- Patent number 4,376,984
- Issue date Mar 15, 1983
- Fujitsu Limited
- Toshitaka Fukushima
- G11 - INFORMATION STORAGE
Information Patent Grant
Programmable read-only memory device
- Patent number 4,347,584
- Issue date Aug 31, 1982
- Fujitsu Limited
- Toshitaka Fukushima
- G11 - INFORMATION STORAGE
Information Patent Grant
Field programmable device having test provisions for fault detection
- Patent number 4,320,507
- Issue date Mar 16, 1982
- Fujitsu Limited
- Toshitaka Fukushima
- G11 - INFORMATION STORAGE
Information Patent Grant
Surge arrester assembly
- Patent number 4,319,300
- Issue date Mar 9, 1982
- TII Industries, Inc.
- John Napiorkowski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Programming circuit for permanently storing data in a programmable...
- Patent number 4,319,341
- Issue date Mar 9, 1982
- Fujitsu Limited
- Toshitaka Fukushima
- G11 - INFORMATION STORAGE

Kazumi Koyama

Person

Patents Grantslast 30 patents

Tristate output buffer with high-impedance state responsive to incr...

Field programmable device with circuitry for detecting poor insulat...

Field programmable device with internal dynamic test circuit

Semiconductor memory device

Programmable read-only memory device

Programmable read-only memory device

Field programmable device having test provisions for fault detection

Surge arrester assembly

Programming circuit for permanently storing data in a programmable...